A capacitance and conductance measurements of two-terminal metal-oxide-semiconductor-oxide-semiconductor capacitors on silicon-on-insulator substrates

Denis Flandre, Francesca Campabadal, Joan Esteve, E. Lora-Tamayo, Febe Van de Wiele

Research output: Contribution to journalArticleResearch

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)5111-5113
JournalJournal of Applied Physics
Volume70
Issue number9
Publication statusPublished - 1 Nov 1991

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