Original language | English |
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Pages (from-to) | 5111-5113 |
Journal | Journal of Applied Physics |
Volume | 70 |
Issue number | 9 |
Publication status | Published - 1 Nov 1991 |
A capacitance and conductance measurements of two-terminal metal-oxide-semiconductor-oxide-semiconductor capacitors on silicon-on-insulator substrates
Denis Flandre, Francesca Campabadal, Joan Esteve, E. Lora-Tamayo, Febe Van de Wiele
Research output: Contribution to journal › Article › Research
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(Scopus)