1998 IEEE International reliability physics symposium proceedings. "Switching behavior of the soft-breakdown conduction characteristic ultra thin (<5nm) oxide MOS capacitors". 1998 IEEE International reliability physics symposium.

E. Miranda, R. Rodríguez, M. Nafría, X. Aymerich, electron device society and the reliability society of the IEEE. The (Editor), Jorge Francisco Suñe Tarruella

Research output: Book/ReportProceedingResearch

Original languageUndefined/Unknown
Place of PublicationReno (US)
Number of pages5
Publication statusPublished - Jun 1998

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