Project Details
Description
Unavailable
| Status | Finished |
|---|---|
| Effective start/end date | 1/01/11 → 31/12/14 |
Variabilidad y fiabilidad en dispositivos electrónicos avanzados: de la nanoescala al circuito (VARENAC)
- Nafria Maqueda, Montserrat (Principal Investigator)
- Amat Bertran, Esteve (Investigator)
- Ayala Cintas, Nuria (Investigator)
- Aymerich Humet, Francisco Javier (Investigator)
- Bayerl , Albin (Investigator)
- Crespo Yepes, Albert (Investigator)
- Iglesias Santiso, Vanessa (Investigator)
- Lanza Martínez, Mario (Investigator)
- Martin Martinez, Javier (Investigator)
- Porti Pujal, Marc (Investigator)
- Rodriguez Martinez, Rosana (Investigator)
- Velayudhan , Vikas (Investigator)
- Moras Albero, Miquel (Investigator)
- Maestro Izquierdo, Marcos (Investigator)
- Couso Fontanillo, Carlos (Investigator)
- Diaz Fortuny, Javier (Others)
- Claramunt Ruiz, Sergi (Investigator)