THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)

Rodriguez Martinez, Rosana (Principal Investigator)
Nafria Maqueda, Montserrat (Principal Investigator 2)
Diaz Fortuny, Javier (Collaborator)
Pedreira Rincon, Gerard (Collaborator)
Pedro Puig, Marta (Collaborator)
Ruiz Flores, Ana (Collaborator)
Salvador Aguilera, Emili (Collaborator)
Aymerich Humet, Francisco Javier (Investigator)
Crespo Yepes, Albert (Investigator)
Martin Martinez, Javier (Investigator)
Porti Pujal, Marc (Investigator)
Valdivieso Leon, Carlos Andres (Collaborator)
Claramunt Ruiz, Sergi (Collaborator)

Department of Electronic Engineering

Status	Active
Effective start/end date	1/06/20 → 29/02/24

2 Article

Assessment of the variability of the I-V characteristic of HfO2-based resistive switching devices and its simulation using the quasi-static memdiode model
Miranda, E., Salvador Aguilera, E., Bargallo Gonzalez, M., Campabadal, F., Martin-Martinez, J. & Rodriguez, R., Aug 2023, In: Solid-State Electronics. 206, 10 p., 108667.
Research output: Contribution to journal › Article › Research › peer-review

Open Access
1 Citation (Scopus)
SPICE modeling of cycle-to-cycle variability in RRAM devices
Martin Martinez, J., Rodríguez Martínez, R., Miranda, E., Salvador Aguilera, E., Bargallo Gonzalez, M. & Campabadal, F., 2021, In: Solid-State Electronics. 185
Research output: Contribution to journal › Article › Research › peer-review

Open Access
9 Citations (Scopus)