The main objective of this project is the development of a depth analysis system based on the analysis of a monocular sequence of static images by analyzing its defocusing. The aim of the project is to become a useful tool in two different fields: microscopic and natural images. In the first case, this method allows the obtention of a depth map of microscopic samples, which has a great interest in application such as visual inspection of integrated circuits. In the second case, depth maps could be interesting for architectural applications. This project, and more concretely its application to the inspection of integrated circuits, follows a previous project devoted to the inspection of integrated circuits and it is based on its results and material.
|Effective start/end date||19/05/94 → 19/05/97|