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Theses and Supervised work
DISPOSITIVOS IONICO-ELECTRONICOS BASADOS EN OXIDOS PARA MEMORIAS NO VOLATILES Y NANOELECTRONICA RECONFIGURABLE
Suñe Tarruella, Jorge Francisco
(Principal Investigator)
Saura Mas, Xavier
(Scholar)
Xiaojuan , Lian
(Scholar)
Long , Shibing
(Collaborator)
Cartoixa Soler, Xavier
(Investigator)
Jimenez, D.
(Investigator)
Miranda Castellano, Enrique Alberto
(Investigator)
Department of Electronic Engineering
Overview
Fingerprint
Research output
(1)
Project Details
Description
Not available
Status
Finished
Effective start/end date
1/01/13
→
31/12/15
Funding
Spanish Ministry of Economy and Competitiveness (MINECO):
€234,819.00
European Regional Development Fund (FEDER)
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Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.
Memoria
Keyphrases
100%
Reconfigurable
Keyphrases
100%
Cell-based
Keyphrases
50%
Percolation Model
Keyphrases
50%
Gate Dielectric Breakdown
Keyphrases
50%
Compact Analytical Model
Keyphrases
50%
Resistive
Engineering
50%
Gate Dielectric
Engineering
50%
Research output
Research output per year
2013
2013
2013
1
Chapter
Research output per year
Research output per year
Compact analytical models for the SET and RESET switching statistics of RRAM inspired in the cell-based percolation model of gate dielectric breakdown
Long, S., Lian, X., Cagli, C., Perniola, L.,
Miranda, E.
,
Jimenez, D.
, Lv, H., Liu, Q., Li, L., Huo, Z., Liu, M. &
Suñé, J.
,
2013
,
2013 IEEE International Reliability Physics Symposium (IRPS).
p. 5A.6.1-5A.6.8
8 p.
(IEEE International Reliability Physics Symposium Proceedings).
Research output
:
Chapter in Book
›
Chapter
›
Research
›
peer-review
Cell-based
100%
Percolation Model
100%
Gate Dielectric Breakdown
100%
Compact Analytical Model
100%
Resistive
100%
14
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Citations (Scopus)