Projects per year
Personal profile
Education/Academic qualification
Ph. D., Universitat Autònoma de Barcelona (UAB)
Award Date: 1 Mar 1980
Degree, Universitat Autònoma de Barcelona (UAB)
Award Date: 1 Jun 1975
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Dive into the research topics where Francisco Javier Aymerich Humet is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J. & Porti Pujal, M.
1/06/20 → 31/05/23
Project
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J. & Rodriguez Martinez, R.
30/12/16 → 29/06/21
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Variabilidad y fiabilidad en dispositivos electrónicos avanzados: de la nanoescala al circuito (VARENAC)
Nafria Maqueda, M., Amat Bertran, E., Ayala Cintas, N., Aymerich Humet, F. J., Bayerl , A., Crespo Yepes, A., Iglesias Santiso, V., Lanza Martínez, M., Martin Martinez, J., Porti Pujal, M. & Rodriguez Martinez, R.
1/01/11 → 31/12/14
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Prestaciones y Fiabilidad de Dispositivos y Circuitos CMOS Nanoelectrónicos basados en Materiales Alternativos
Nafria Maqueda, M., Martin Martinez, J., Aguilera Martínez, L., Amat Bertran, E., Aymerich Humet, F. J., Boix Gargallo, J., Lanza Martínez, M., Porti Pujal, M., Raul Fernandez Garcia & Rodriguez Martinez, R.
1/10/07 → 30/09/10
Project
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A CAFM and device level study of MIS structures with graphene as interfacial layer for ReRAM applications
Nafria, M., Porti Pujal, M., Aymerich Humet, F. J., Claramunt Ruiz, S., Ruiz Flores, A. & Wu, Q., 1 Dec 2021, In: SOLID-STATE ELECTRONICS. 186, 108080.Research output: Contribution to journal › Article › Research › peer-review
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AFM oxidation of Ti for nanoscale IC applications
Hill, D., Sadewasser, S. & Aymerich, X., 1 Jan 2018, Microscopy of Semiconducting Materials 2003. p. 665-668 3 p.Research output: Chapter in Book › Chapter › Research › peer-review
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Experimental Time Evolution Study of the HfO<inf>2</inf>-Based IMPLY Gate Operation
Maestro-Izquierdo, M., Martin-Martinez, J., Yepes, A. C., Escudero, M., Rodriguez, R., Nafria, M., Aymerich, X. & Rubio, A., 1 Feb 2018, In: IEEE Transactions on Electron Devices. 65, 2, p. 404-410 8245876.Research output: Contribution to journal › Article › Research › peer-review
3 Citations (Scopus) -
Experimental Time Evolution Study of the HfO2-Based IMPLY Gate Operation
Nafria, M., Maestro Izquierdo, M., Crespo Yepes, A., Martin Martinez, J., Rodriguez Martinez, R. & Aymerich Humet, F. J., 2018, In: IEEE Transactions on Electron Devices. 65, 2Research output: Contribution to journal › Article › Research › peer-review
3 Citations (Scopus) -
Efficient methodology to extract interface traps parameters for TCAD simulations
Couso, C., Martin-Martinez, J., Porti, M., Nafria, M. & Aymerich, X., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 66-70Research output: Contribution to journal › Article › Research › peer-review
2 Citations (Scopus)