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  • 34 Citations
  • 4 h-Index
20152017

Research output per year

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Research Output

  • 34 Citations
  • 4 h-Index
  • 6 Article

Inkjet printed HfO<inf>2</inf>-based ReRAMs: First demonstration and performance characterization

Vescio, G., Crespo-Yepes, A., Alonso, D., Claramunt, S., Porti, M., Rodriguez, R., Cornet, A., Cirera, A., Nafria, M. & Aymerich, X., 1 Apr 2017, In : IEEE Electron Device Letters. 38, 4, p. 457-460 7855705.

Research output: Contribution to journalArticleResearchpeer-review

  • 9 Citations (Scopus)

    CAFM Experimental Considerations and Measurement Methodology for In-Line Monitoring and Quantitative Analysis of III-V Materials Defects

    Porti, M., Iglesias, V., Wu, Q., Couso, C., Claramunt, S., Nafría, M., Cordes, A. & Bersuker, G., 1 Nov 2016, In : IEEE Transactions on Nanotechnology. 15, 6, p. 986-992 7600461.

    Research output: Contribution to journalArticleResearchpeer-review

  • 4 Citations (Scopus)

    Conductance of Threading Dislocations in InGaAs/Si Stacks by Temperature-CAFM Measurements

    Couso, C., Iglesias, V., Porti, M., Claramunt, S., Nafría, M., Domingo, N., Cordes, A. & Bersuker, G., 1 May 2016, In : IEEE Electron Device Letters. 37, p. 640-643 7422696.

    Research output: Contribution to journalArticleResearchpeer-review

  • 8 Citations (Scopus)
  • Nanoscale topography-current CAFM temperature study of Threading Dislocations in InGaAs channel materials

    Couso, C., Iglesias, V., Porti, M., Claramunt, S., Nafría, M., Domingo, N., Bersuker, G. & Cordes, A., 1 Jan 2015, In : Applied Physics Letters. p. -

    Research output: Contribution to journalArticleResearch