Projects per year
Personal profile
Education/Academic qualification
Ph. D., Doctorat, Universitat Autònoma de Barcelona (UAB)
Award Date: 1 Jan 2000
Degree, Ingeniería de Telecomunicación, Universitat Politècnica de Catalunya (UPC)
Award Date: 6 Jul 1995
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- 1 Similar Profiles
Collaborations and top research areas from the last five years
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RELIABILITY, SECURITY AND ENERGY EFFICIENCY IN ELECTRONIC DEVICES AND CIRCUITS FOR IOT EDGE (TIRELESS-UAB)
Nafria Maqueda, M. (Principal Investigator), Porti Pujal, M. (Principal Investigator 2), Crespo Yepes, A. (Investigator), Martin Martinez, J. (Investigator), Rodriguez Martinez, R. (Investigator), Valdivieso Leon, C. A. (Collaborator) & Salvador Aguilera, E. (Collaborator)
1/09/23 → 31/08/27
Project: Research Projects and Other Grants
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R. (Principal Investigator), Nafria Maqueda, M. (Principal Investigator 2), Diaz Fortuny, J. (Collaborator), Pedreira Rincon, G. (Collaborator), Pedro Puig, M. (Collaborator), Ruiz Flores, A. (Collaborator), Salvador Aguilera, E. (Collaborator), Aymerich Humet, F. J. (Investigator), Crespo Yepes, A. (Investigator), Martin Martinez, J. (Investigator), Porti Pujal, M. (Investigator), Valdivieso Leon, C. A. (Collaborator) & Claramunt Ruiz, S. (Collaborator)
1/06/20 → 29/02/24
Project: Research Projects and Other Grants
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Beneficio del ruido en la respuesta de menrístores para el desarrollo de sistemas de computación alternativas y avanzadas.
Rodriguez Martinez, R. (Principal Investigator), Crespo Yepes, A. (Collaborator), Pedro Puig, M. (Collaborator), Salvador Aguilera, E. (Collaborator), Martin Martinez, J. (Investigator), Nafria Maqueda, M. (Investigator) & Rubio Solá, A. (Investigator)
Spanish Ministry of Economy and Competitiveness (MINECO)
1/11/18 → 30/09/21
Project: Research Projects and Other Grants
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M. (Principal Investigator), Porti Pujal, M. (Principal Investigator 2), Diaz Fortuny, J. (Collaborator), Pedro Puig, M. (Collaborator), Ruiz Flores, A. (Collaborator), Aymerich Humet, F. J. (Investigator), Crespo Yepes, A. (Investigator), Martin Martinez, J. (Investigator), Rodriguez Martinez, R. (Investigator) & Pedreira Rincon, G. (Collaborator)
Spanish Ministry of Economy and Competitiveness (MINECO)
30/12/16 → 29/06/21
Project: Research Projects and Other Grants
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Red Temática en Varibilidad en Nanoelectrónica
Nafria Maqueda, M. (Principal Investigator), Couso Fontanillo, C. (Collaborator), Diaz Fortuny, J. (Collaborator), Rodríguez Fernández, A. (Collaborator), Martin Martinez, J. (Collaborator), Claramunt Ruiz, S. (Collaborator), Pedro Puig, M. (Collaborator), Porti Pujal, M. (Collaborator) & Rodriguez Martinez, R. (Collaborator)
Spanish Ministry of Economy and Competitiveness (MINECO)
1/12/14 → 30/11/17
Project: Research Projects and Other Grants
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Stochastic Resonance in HfO2-Based Memristors : Impact of External Noise on the Binary STDP Protocol
Salvador Aguilera, E., Rodríguez Martínez, R., Miranda, E., Martin Martinez, J., Rubio, A., Ntinas, V., Sirakoulis, G. C., Crespo Yepes, A. & Nafría i Maqueda, M., 9 Aug 2024, In: IEEE transactions on electron devices. 71, 9, p. 5761-5766 6 p.Research output: Contribution to journal › Article › Research › peer-review
Open Access -
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
Martin-Martinez, J., Diaz-Fortuny, J., Saraza-Canflanca, P., Rodriguez, R., Castro-Lopez, R., Roca, E., Fernandez, F. V. & Nafria, M., 2023, Institute of Electrical and Electronics Engineers Inc. 9 p. (IEEE International Reliability Physics Symposium Proceedings; vol. 2023-March)Research output: Book/Report › Proceeding › Research › peer-review
Open Access2 Citations (Scopus)1 Downloads (Pure) -
Impact of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs
Valdivieso, C., Crespo-Yepes, A., Miranda, R., Bernal, D., Martin-Martinez, J., Rodriguez, R. & Nafria, M., May 2023, In: SOLID-STATE ELECTRONICS. 203, 5 p., 108625.Research output: Contribution to journal › Article › Research › peer-review
Open Access1 Downloads (Pure) -
Random Telegraph Noise and Bias Temperature Instabilities statistical characterization of Ω-gate FDSOI devices at low voltages
Pedreira, G., Martin-Martinez, J., Crespo-Yepes, A., Amat, E., Rodriguez, R. & Nafria, M., Nov 2023, In: SOLID-STATE ELECTRONICS. 209, 4 p., 108735.Research output: Contribution to journal › Article › Research › peer-review
Open Access1 Downloads (Pure) -
Resistive switching like-behavior in FD-SOI Ω-gate transistors
Valdivieso, C., Rodriguez, R., Crespo-Yepes, A., Martin-Martinez, J. & Nafria, M., Nov 2023, In: SOLID-STATE ELECTRONICS. 209, 3 p., 108759.Research output: Contribution to journal › Article › Research › peer-review
Open Access1 Citation (Scopus)1 Downloads (Pure)
Thesis
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Distribuciones de la carga atrapada en el óxido de puerta de dispositivos MOS en condiciones de estrés estático y dinámico
Rodríguez Martínez, R. (Author), Nafría Maqueda, M. (Director), 17 Jul 1997Student thesis: Dissertation (TFM)
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Análisis de la degradación y ruptura dieléctrica de capas finas de SiO2 en dispositivos MOS sometidos a estreses estáticos y dinámicos. (Premio extraordinario de doctorado)
Rodriguez Martinez, R. (Author), Nafría Maqueda, M. (Director), 13 Jul 2000Student thesis: Doctoral thesis