Projects per year
Personal profile
Education/Academic qualification
Ph. D., Doctorat, Universitat Autònoma de Barcelona (UAB)
Award Date: 1 Jan 2000
Degree, Ingeniería de Telecomunicación, Universitat Politècnica de Catalunya (UPC)
Award Date: 6 Jul 1995
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Dive into the research topics where Rosana Rodriguez Martinez is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Porti Pujal, M., Valdivieso Leon, C. A. & Claramunt Ruiz, S.
1/06/20 → 29/02/24
Project: Research Projects and Other Grants
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Beneficio del ruido en la respuesta de menrístores para el desarrollo de sistemas de computación alternativas y avanzadas.
Rodriguez Martinez, R., Crespo Yepes, A., Pedro Puig, M., Salvador Aguilera, E., Martin Martinez, J., Nafria Maqueda, M. & Rubio Solá, A.
1/11/18 → 30/09/21
Project: Research Projects and Other Grants
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Rodriguez Martinez, R. & Pedreira Rincon, G.
30/12/16 → 29/06/21
Project: Research Projects and Other Grants
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Red Temática en Varibilidad en Nanoelectrónica
Nafria Maqueda, M., Couso Fontanillo, C., Diaz Fortuny, J., Rodríguez Fernández, A., Martin Martinez, J., Claramunt Ruiz, S., Pedro Puig, M., Porti Pujal, M. & Rodriguez Martinez, R.
1/12/14 → 30/11/17
Project: Research Projects and Other Grants
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Aproximación multinivel al diseño orientado a la fiabilidad de circuitos integrados analógicos y digitales
Nafria Maqueda, M., Rodriguez Martinez, R., Crespo Yepes, A., Aymerich Humet, F. J., Martin Martinez, J., Porti Pujal, M., Velayudhan , V., Moras Albero, M., Maestro Izquierdo, M., Claramunt Ruiz, S., Couso Fontanillo, C., Diaz Fortuny, J., Pedro Puig, M., Pedreira Rincon, G., Qian Wu, Q. & Ruiz Flores, A.
Ministry of Economy and Competitiveness (MINECO)
1/01/14 → 31/12/18
Project: Research Projects and Other Grants
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Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
Martin-Martinez, J., Diaz-Fortuny, J., Saraza-Canflanca, P., Rodriguez, R., Castro-Lopez, R., Roca, E., Fernandez, F. V. & Nafria, M., 2023, Institute of Electrical and Electronics Engineers Inc. 9 p. (IEEE International Reliability Physics Symposium Proceedings; vol. 2023-March)Research output: Book/Report › Proceeding › Research › peer-review
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CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging
Crespo-Yepes, A., Nasarre, C., Garsot, N., Martin-Martinez, J., Rodriguez, R., Barajas, E., Aragones, X., Mateo, D. & Nafria, M., May 2022, In: SOLID-STATE ELECTRONICS. 191, 8 p., 108264.Research output: Contribution to journal › Article › Research › peer-review
1 Citation (Scopus) -
Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs
Valdivieso, C., Crespo-Yepes, A., Miranda, R., Bernal, D., Martin-Martinez, J., Rodriguez, R. & Nafria, M., Aug 2022, In: SOLID-STATE ELECTRONICS. 194, 4 p., 108324.Research output: Contribution to journal › Article › Research › peer-review
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Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs
Saraza-Canflanca, P., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M. & Fernandez, F. V., 1 Oct 2022, In: IEEE Transactions on Electron Devices. 69, 10, p. 5424-5429 6 p.Research output: Contribution to journal › Article › Research › peer-review
2 Citations (Scopus) -
On the Impact of the Biasing History on the Characterization of Random Telegraph Noise
Saraza-Canflanca, P., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M. & Fernandez, F. V., 2022, In: IEEE Transactions on Instrumentation and Measurement. 71, 9 p., 2003410.Research output: Contribution to journal › Article › Research › peer-review
Thesis
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Distribuciones de la carga atrapada en el óxido de puerta de dispositivos MOS en condiciones de estrés estático y dinámico
Author: Rodríguez Martínez, R., 17 Jul 1997Supervisor: Nafría Maqueda, M. (Director)
Student thesis: Dissertation (TFM)
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Análisis de la degradación y ruptura dieléctrica de capas finas de SiO2 en dispositivos MOS sometidos a estreses estáticos y dinámicos. (Premio extraordinario de doctorado)
Author: Rodriguez Martinez, R., 13 Jul 2000Supervisor: Nafría Maqueda, M. (Director)
Student thesis: Doctoral thesis