Projects per year
Personal profile
Education/Academic qualification
Ph. D., Universitat Autònoma de Barcelona (UAB)
Award Date: 1 Jan 2000
Degree, Universitat Politècnica de Catalunya (UPC)
Award Date: 6 Jul 1995
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J. & Porti Pujal, M.
1/06/20 → 31/05/23
Project
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J. & Rodriguez Martinez, R.
30/12/16 → 29/06/21
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Aproximación multinivel al diseño orientado a la fiabilidad de circuitos integrados analógicos y digitales
Nafria Maqueda, M., Rodriguez Martinez, R., Crespo Yepes, A., Aymerich Humet, F. J., Martin Martinez, J. & Porti Pujal, M.
Ministerio de Economia y Competitividad (MINECO)
1/01/14 → 31/12/18
Project
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Aging in CMOS RF Linear Power Amplifiers: An Experimental Study
Nafria, M., Martin Martinez, J., Crespo Yepes, A., Rodriguez Martinez, R., Barajas, E., Mateo, D. & Aragones, X., 1 Feb 2021, In: IEEE Transactions on Microwave Theory and Techniques. 69, 2, p. 1453-1463 11 p., 9290396.Research output: Contribution to journal › Article › Research › peer-review
4 Citations (Scopus) -
Advanced characterization and analysis of random telegraph noise in CMOS devices
Martin-Martinez, J., Rodriguez, R. & Nafria, M., 26 Apr 2020, Noise in Nanoscale Semiconductor Devices. Springer International Publishing AG, p. 467-493 27 p.Research output: Chapter in Book › Chapter › Research › peer-review
3 Citations (Scopus) -
DC Characterization and Fast Small-Signal Parameter Extraction of Organic Thin Film Transistors With Different Geometries
Nafria, M., Crespo Yepes, A., Rodriguez Martinez, R., Arnal, A., Ramon, E. & Terés Terés, L. A., Oct 2020, In: IEEE Electron Device Letters. 41, 10Research output: Contribution to journal › Article › Research › peer-review
4 Citations (Scopus) -
Exploring the "Resistance Change per Energy Unit" as Universal Performance Parameter for Resistive Switching Devices
Nafria, M., Rodriguez Martinez, R. & Martin Martinez, J., 2020, In: Solid-State Electronics. 165, 107748.Research output: Contribution to journal › Article › Research › peer-review
2 Citations (Scopus) -
Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits
Nafria, M., Martin Martinez, J., Rodriguez Martinez, R., Diaz Fortuny, J., Saraza-Canflanca, P., Castro-Lopez, R., Roca, E. & Fernandez, F. V., Mar 2020, In: IEEE Transactions on Instrumentation and Measurement. 69, 3Research output: Contribution to journal › Article › Research › peer-review
7 Citations (Scopus)