Projects per year
Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
Education/Academic qualification
Ph. D., Doctora en Ciencias Físicas, Universitat Autònoma de Barcelona (UAB)
Award Date: 9 Jun 1993
Degree, Llicenciat Ciencies Físiques, Universitat Autònoma de Barcelona (UAB)
Award Date: 1 Jan 1989
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Collaborations and top research areas from the last five years
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Porti Pujal, M., Valdivieso Leon, C. A. & Claramunt Ruiz, S.
1/06/20 → 29/02/24
Project: Research Projects and Other Grants
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Beneficio del ruido en la respuesta de menrístores para el desarrollo de sistemas de computación alternativas y avanzadas.
Rodriguez Martinez, R., Crespo Yepes, A., Pedro Puig, M., Salvador Aguilera, E., Martin Martinez, J., Nafria Maqueda, M. & Rubio Solá, A.
1/11/18 → 30/09/21
Project: Research Projects and Other Grants
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Rodriguez Martinez, R. & Pedreira Rincon, G.
30/12/16 → 29/06/21
Project: Research Projects and Other Grants
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Red Temática en Varibilidad en Nanoelectrónica
Nafria Maqueda, M., Couso Fontanillo, C., Diaz Fortuny, J., Rodríguez Fernández, A., Martin Martinez, J., Claramunt Ruiz, S., Pedro Puig, M., Porti Pujal, M. & Rodriguez Martinez, R.
1/12/14 → 30/11/17
Project: Research Projects and Other Grants
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Aproximación multinivel al diseño orientado a la fiabilidad de circuitos integrados analógicos y digitales
Nafria Maqueda, M., Rodriguez Martinez, R., Crespo Yepes, A., Aymerich Humet, F. J., Martin Martinez, J., Porti Pujal, M., Velayudhan , V., Moras Albero, M., Maestro Izquierdo, M., Claramunt Ruiz, S., Couso Fontanillo, C., Diaz Fortuny, J., Pedro Puig, M., Pedreira Rincon, G., Qian Wu, Q. & Ruiz Flores, A.
Ministry of Economy and Competitiveness (MINECO)
1/01/14 → 31/12/18
Project: Research Projects and Other Grants
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A Smart Measurement System for the Combined Nanoscale and Device Level Characterization of Electron Devices: Implementation Using Ink-Jet Printing Technologies
Claramunt, S., Arrese, J., Ruiz, A., Porti, M., Cirera, A. & Nafria, M., 1 Jan 2023, In: IEEE Transactions on Nanotechnology. 22, p. 28-35 8 p.Research output: Contribution to journal › Article › Research › peer-review
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Exploitation of OTFTs variability for PUFs implementation and impact of aging
Claramunt Ruiz, S., Palau, G., Arnal, A., Crespo Yepes, A., Porti Pujal, M., Ogier, S., Ramon, E. & Nafria, M., Sept 2023, In: Solid-State Electronics. 207, 4 p., 108698.Research output: Contribution to journal › Article › Research › peer-review
Open Access -
A CAFM and device level study of MIS structures with graphene as interfacial layer for ReRAM applications
Nafria, M., Porti Pujal, M., Aymerich Humet, F. J., Claramunt Ruiz, S., Ruiz Flores, A. & Wu, Q., 1 Dec 2021, In: SOLID-STATE ELECTRONICS. 186, 108080.Research output: Contribution to journal › Article › Research › peer-review
1 Downloads (Pure) -
Aging in CMOS RF Linear Power Amplifiers: An Experimental Study
Nafria, M., Martin Martinez, J., Crespo Yepes, A., Rodriguez Martinez, R., Barajas, E., Mateo, D. & Aragones, X., 1 Feb 2021, In: IEEE Transactions on Microwave Theory and Techniques. 69, 2, p. 1453-1463 11 p., 9290396.Research output: Contribution to journal › Article › Research › peer-review
8 Citations (Web of Science) -
Circuit reliability prediction: Challenges and solutions for the device time-dependent variability characterization roadblock
Nafria, M., Diaz-Fortuny, J., Saraza-Canflanca, P., Martin-Martinez, J., Roca, E., Castro-Lopez, R., Rodriguez, R., Martin-Lloret, P., Toro-Frias, A., Mateo, D., Barajas, E., Aragones, X. & Fernandez, F. V., 19 Apr 2021, In: LAEDC 2021 - IEEE Latin America Electron Devices Conference.Research output: Contribution to journal › Article › Research › peer-review
Thesis
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Análisis de la ruptura dieléctrica del SiO\sub 2\nosub para la simulación de fiabilidad
Author: Nafría Maqueda, M., 28 May 1993Supervisor: Aymerich Humet, X. (Director)
Student thesis: Doctoral thesis
Organisations
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Enginyeria de Dispositius Electrònics / Electron Device Engineering
Department of Electronic Engineering
Organisational unit: Research Group