Projects per year
Personal profile
Education/Academic qualification
Ph. D., Universitat Autònoma de Barcelona (UAB)
Award Date: 9 Jun 1993
Degree, Universitat Autònoma de Barcelona (UAB)
Award Date: 1 Jan 1989
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Dive into the research topics where Montserrat Nafria Maqueda is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J. & Porti Pujal, M.
1/06/20 → 31/05/23
Project
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J. & Rodriguez Martinez, R.
30/12/16 → 29/06/21
Project
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Research output
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A CAFM and device level study of MIS structures with graphene as interfacial layer for ReRAM applications
Nafria, M., Porti Pujal, M., Aymerich Humet, F. J., Claramunt Ruiz, S., Ruiz Flores, A. & Wu, Q., 1 Dec 2021, In: SOLID-STATE ELECTRONICS. 186, 108080.Research output: Contribution to journal › Article › Research › peer-review
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Aging in CMOS RF Linear Power Amplifiers: An Experimental Study
Nafria, M., Martin Martinez, J., Crespo Yepes, A., Rodriguez Martinez, R., Barajas, E., Mateo, D. & Aragones, X., 1 Feb 2021, In: IEEE Transactions on Microwave Theory and Techniques. 69, 2, p. 1453-1463 11 p., 9290396.Research output: Contribution to journal › Article › Research › peer-review
3 Citations (Scopus) -
Circuit reliability prediction: Challenges and solutions for the device time-dependent variability characterization roadblock
Nafria, M., Diaz-Fortuny, J., Saraza-Canflanca, P., Martin-Martinez, J., Roca, E., Castro-Lopez, R., Rodriguez, R., Martin-Lloret, P., Toro-Frias, A., Mateo, D., Barajas, E., Aragones, X. & Fernandez, F. V., 19 Apr 2021, In: LAEDC 2021 - IEEE Latin America Electron Devices Conference.Research output: Contribution to journal › Article › Research › peer-review
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Exploiting the KPFM capabilities to analyze at the nanoscale the impact of electrical stresses on OTFTs properties
Ruiz, A., Claramunt, S., Crespo-Yepes, A., Porti, M., Nafria, M., Xu, H., Liu, C. & Wu, Q., 1 Dec 2021, In: SOLID-STATE ELECTRONICS. 186, 108061.Research output: Contribution to journal › Article › Research › peer-review
1 Citation (Scopus) -
Modeling of the degradation of CMOS inverters under pulsed stress conditions from ‘on-the-fly’ measurements
Crespo-Yepes, A., Ramos, R., Barajas, E., Aragones, X., Mateo, D., Martin-Martinez, J., Rodriguez, R. & Nafria, M., 1 Oct 2021, In: SOLID-STATE ELECTRONICS. 184, 7 p., 108094.Research output: Contribution to journal › Article › Research › peer-review