Projects per year
Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
Education/Academic qualification
Ph. D., Doctorat, Universitat Autònoma de Barcelona (UAB)
Award Date: 8 Apr 2003
Degree, Llicenciat, Universitat Autònoma de Barcelona (UAB)
Award Date: 15 Jun 1997
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Collaborations and top research areas from the last five years
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Porti Pujal, M., Valdivieso Leon, C. A. & Claramunt Ruiz, S.
1/06/20 → 29/02/24
Project: Research Projects and Other Grants
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Rodriguez Martinez, R. & Pedreira Rincon, G.
30/12/16 → 29/06/21
Project: Research Projects and Other Grants
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Red Temática en Varibilidad en Nanoelectrónica
Nafria Maqueda, M., Couso Fontanillo, C., Diaz Fortuny, J., Rodríguez Fernández, A., Martin Martinez, J., Claramunt Ruiz, S., Pedro Puig, M., Porti Pujal, M. & Rodriguez Martinez, R.
1/12/14 → 30/11/17
Project: Research Projects and Other Grants
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Aproximación multinivel al diseño orientado a la fiabilidad de circuitos integrados analógicos y digitales
Nafria Maqueda, M., Rodriguez Martinez, R., Crespo Yepes, A., Aymerich Humet, F. J., Martin Martinez, J., Porti Pujal, M., Velayudhan , V., Moras Albero, M., Maestro Izquierdo, M., Claramunt Ruiz, S., Couso Fontanillo, C., Diaz Fortuny, J., Pedro Puig, M., Pedreira Rincon, G., Qian Wu, Q. & Ruiz Flores, A.
Ministry of Economy and Competitiveness (MINECO)
1/01/14 → 31/12/18
Project: Research Projects and Other Grants
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Variabilidad y fiabilidad en dispositivos electrónicos avanzados: de la nanoescala al circuito (VARENAC)
Nafria Maqueda, M., Amat , E., Ayala Cintas, N., Aymerich Humet, F. J., Bayerl , A., Crespo Yepes, A., Iglesias Santiso, V., Lanza Martínez, M., Martin Martinez, J., Porti Pujal, M., Rodriguez Martinez, R., Velayudhan , V., Moras Albero, M., Maestro Izquierdo, M., Couso Fontanillo, C., Diaz Fortuny, J. & Claramunt Ruiz, S.
1/01/11 → 31/12/14
Project: Research Projects and Other Grants
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A Smart Measurement System for the Combined Nanoscale and Device Level Characterization of Electron Devices: Implementation Using Ink-Jet Printing Technologies
Claramunt, S., Arrese, J., Ruiz, A., Porti, M., Cirera, A. & Nafria, M., 1 Jan 2023, In: IEEE Transactions on Nanotechnology. 22, p. 28-35 8 p.Research output: Contribution to journal › Article › Research › peer-review
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Exploitation of OTFTs variability for PUFs implementation and impact of aging
Claramunt Ruiz, S., Palau, G., Arnal, A., Crespo Yepes, A., Porti Pujal, M., Ogier, S., Ramon, E. & Nafria, M., Sept 2023, In: Solid-State Electronics. 207, 4 p., 108698.Research output: Contribution to journal › Article › Research › peer-review
Open Access -
A CAFM and device level study of MIS structures with graphene as interfacial layer for ReRAM applications
Nafria, M., Porti Pujal, M., Aymerich Humet, F. J., Claramunt Ruiz, S., Ruiz Flores, A. & Wu, Q., 1 Dec 2021, In: SOLID-STATE ELECTRONICS. 186, 108080.Research output: Contribution to journal › Article › Research › peer-review
1 Downloads (Pure) -
Exploiting the KPFM capabilities to analyze at the nanoscale the impact of electrical stresses on OTFTs properties
Ruiz, A., Claramunt, S., Crespo-Yepes, A., Porti, M., Nafria, M., Xu, H., Liu, C. & Wu, Q., 1 Dec 2021, In: SOLID-STATE ELECTRONICS. 186, 108061.Research output: Contribution to journal › Article › Research › peer-review
2 Citations (Scopus) -
Methodology for the Simulation of the Variability of MOSFETs with Polycrystalline High-k Dielectrics Using CAFM Input Data
Ruiz, A., Couso, C., Seoane, N., Porti, M., Garcia-Loureiro, A. J. & Nafria, M., 2021, In: IEEE Access. 9, p. 90568-90576 9 p., 9462835.Research output: Contribution to journal › Article › Research › peer-review
Open Access1 Citation (Scopus)
Thesis
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Caracterització a escala nanomètrica de la degradació i ruptura dielèctrica del SiO2 en dispositius MOS mitjançant C-AFM
Author: Porti Pujal, M., 4 Apr 2003Supervisor: Aymerich Humet, X. (Director) & Nafría Maqueda, M. (Director)
Student thesis: Doctoral thesis