Projects per year
Personal profile
Education/Academic qualification
Ph. D., Universitat Autònoma de Barcelona (UAB)
Award Date: 8 Apr 2003
Degree, Universitat Autònoma de Barcelona (UAB)
Award Date: 15 Jun 1997
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Dive into the research topics where Marc Porti Pujal is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J. & Porti Pujal, M.
1/06/20 → 31/05/23
Project
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J. & Rodriguez Martinez, R.
30/12/16 → 29/06/21
Project
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Variabilidad y fiabilidad en dispositivos electrónicos avanzados: de la nanoescala al circuito (VARENAC)
Nafria Maqueda, M., Amat Bertran, E., Ayala Cintas, N., Aymerich Humet, F. J., Bayerl , A., Crespo Yepes, A., Iglesias Santiso, V., Lanza Martínez, M., Martin Martinez, J., Porti Pujal, M. & Rodriguez Martinez, R.
1/01/11 → 31/12/14
Project
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Advanced CMOS devices based in alternative dielectrics: performance and reliability
Nafria Maqueda, M., Bayerl , A., Martin Martinez, J., Aguilera Martínez, L., Benstetter, Günther, Lanza Martínez, M., Porti Pujal, M. & Rodriguez Martinez, R.
1/01/08 → 31/03/10
Project
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A CAFM and device level study of MIS structures with graphene as interfacial layer for ReRAM applications
Nafria, M., Porti Pujal, M., Aymerich Humet, F. J., Claramunt Ruiz, S., Ruiz Flores, A. & Wu, Q., 1 Dec 2021, In: SOLID-STATE ELECTRONICS. 186, 108080.Research output: Contribution to journal › Article › Research › peer-review
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Exploiting the KPFM capabilities to analyze at the nanoscale the impact of electrical stresses on OTFTs properties
Ruiz, A., Claramunt, S., Crespo-Yepes, A., Porti, M., Nafria, M., Xu, H., Liu, C. & Wu, Q., 1 Dec 2021, In: SOLID-STATE ELECTRONICS. 186, 108061.Research output: Contribution to journal › Article › Research › peer-review
1 Citation (Scopus) -
MIS structures with interfacial graphene for ReRAM applications: A nanoscale and device level characterization
Claramunt, S., Ruiz, A., Wu, Q., Porti, M., Nafria, M. & Aymerich, X., 1 Sep 2020, In: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2020.Research output: Contribution to journal › Article › Research › peer-review
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Combined nanoscale KPFM characterization and device simulation for the evaluation of the MOSFET variability related to metal gate workfunction fluctuations
Porti, M. & Nafria, M., 15 Aug 2019, In: Microelectronic Engineering. 216, 4 p., 111048.Research output: Contribution to journal › Article › Research
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Low-power, high-performance, non-volatile inkjet-printed HfO<inf>2</inf>-based resistive random access memory: From device to nanoscale characterization
Vescio, G., Martín, G., Crespo-Yepes, A., Claramunt, S., Alonso, D., Lopez-Vidrier, J., Estrade, S., Porti, M., Rodríguez, R., Peiro, F., Cornet, A., Cirera, A. & Nafría, M., 3 Jul 2019, In: ACS Applied Materials & Interfaces. 11, 26, p. 23659-23666 8 p.Research output: Contribution to journal › Article › Research
4 Citations (Scopus)