Projects per year
Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
Education/Academic qualification
Ph. D., Doctorat, Universitat Autònoma de Barcelona (UAB)
Award Date: 8 Apr 2003
Degree, Llicenciat, Universitat Autònoma de Barcelona (UAB)
Award Date: 15 Jun 1997
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Collaborations and top research areas from the last five years
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RELIABILITY, SECURITY AND ENERGY EFFICIENCY IN ELECTRONIC DEVICES AND CIRCUITS FOR IOT EDGE (TIRELESS-UAB)
Nafria Maqueda, M. (Principal Investigator), Porti Pujal, M. (Co-Investigador/a Principal), Crespo Yepes, A. (Investigator), Martin Martinez, J. (Investigator), Rodriguez Martinez, R. (Investigator), Valdivieso Leon, C. A. (Collaborator), Salvador Aguilera, E. (Collaborator), Goyal Goyal, R. (Collaborator) & Baghban Bousari, N. (Collaborator)
1/09/23 → 31/08/27
Project: Research Projects and Other Grants
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R. (Principal Investigator), Nafria Maqueda, M. (Co-Investigador/a Principal), Diaz Fortuny, J. (Collaborator), Pedreira Rincon, G. (Collaborator), Pedro Puig, M. (Collaborator), Ruiz Flores, A. (Collaborator), Salvador Aguilera, E. (Collaborator), Aymerich Humet, F. J. (Investigator), Crespo Yepes, A. (Investigator), Martin Martinez, J. (Investigator), Porti Pujal, M. (Investigator), Valdivieso Leon, C. A. (Collaborator) & Claramunt Ruiz, S. (Collaborator)
1/06/20 → 29/02/24
Project: Research Projects and Other Grants
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M. (Principal Investigator), Porti Pujal, M. (Co-Investigador/a Principal), Diaz Fortuny, J. (Collaborator), Pedro Puig, M. (Collaborator), Ruiz Flores, A. (Collaborator), Aymerich Humet, F. J. (Investigator), Crespo Yepes, A. (Investigator), Martin Martinez, J. (Investigator), Rodriguez Martinez, R. (Investigator) & Pedreira Rincon, G. (Collaborator)
Spanish Ministry of Economy and Competitiveness (MINECO)
30/12/16 → 29/06/21
Project: Research Projects and Other Grants
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Red Temática en Varibilidad en Nanoelectrónica
Nafria Maqueda, M. (Principal Investigator), Couso Fontanillo, C. (Collaborator), Diaz Fortuny, J. (Collaborator), Rodríguez Fernández, A. (Collaborator), Martin Martinez, J. (Collaborator), Claramunt Ruiz, S. (Collaborator), Pedro Puig, M. (Collaborator), Porti Pujal, M. (Collaborator) & Rodriguez Martinez, R. (Collaborator)
Spanish Ministry of Economy and Competitiveness (MINECO)
1/12/14 → 30/11/17
Project: Research Projects and Other Grants
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Aproximación multinivel al diseño orientado a la fiabilidad de circuitos integrados analógicos y digitales
Nafria Maqueda, M. (Principal Investigator), Rodriguez Martinez, R. (Co-Investigador/a Principal), Crespo Yepes, A. (Collaborator), Aymerich Humet, F. J. (Investigator), Martin Martinez, J. (Investigator), Porti Pujal, M. (Investigator), Velayudhan , V. (Collaborator), Moras Albero, M. (Collaborator), Maestro Izquierdo, M. (Collaborator), Claramunt Ruiz, S. (Collaborator), Couso Fontanillo, C. (Collaborator), Diaz Fortuny, J. (Collaborator), Qian Wu, Q. (Collaborator), Pedro Puig, M. (Collaborator), Ruiz Flores, A. (Collaborator) & Pedreira Rincon, G. (Collaborator)
1/01/14 → 31/12/18
Project: Research Projects and Other Grants
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Reliability Assessment of Optical Physical Unclonable Functions Based on the Spatial Distribution of Catastrophic Failure Sites in MIM Structures
Porti, M., Solis, A., Calatayud, A., Nafría, M. & Miranda, E., 17 Feb 2025, In: IEEE Access. 13, p. 33189-33201 13 p.Research output: Contribution to journal › Article › Research › peer-review
Open Access2 Downloads (Pure) -
On the Aging of OTFTs and Its Impact on PUFs Reliability
Porti, M., Palau, G., Crespo-Yepes, A., Rus, A. A., Ogier, S., Ramon, E. & Nafria, M., 26 Mar 2024, In: Micromachines. 15, 4, 10 p., 443.Research output: Contribution to journal › Article › Research › peer-review
Open Access5 Downloads (Pure) -
A Smart Measurement System for the Combined Nanoscale and Device Level Characterization of Electron Devices: Implementation Using Ink-Jet Printing Technologies
Claramunt, S., Arrese, J., Ruiz, A., Porti, M., Cirera, A. & Nafria, M., 1 Jan 2023, In: IEEE Transactions on Nanotechnology. 22, p. 28-35 8 p.Research output: Contribution to journal › Article › Research › peer-review
Open Access1 Downloads (Pure) -
Exploitation of OTFTs variability for PUFs implementation and impact of aging
Claramunt Ruiz, S., Palau, G., Arnal, A., Crespo Yepes, A., Porti Pujal, M., Ogier, S., Ramon Garcia, E. & Nafria, M., Sept 2023, In: Solid-State Electronics. 207, 4 p., 108698.Research output: Contribution to journal › Article › Research › peer-review
Open Access2 Citations (Scopus)1 Downloads (Pure) -
Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
Porti, M., Redon, M., Munoz, J., Nafria, M. & Miranda, E., Oct 2023, In: IEEE Electron Device Letters. 44, 10, p. 1600-1603 4 p.Research output: Contribution to journal › Article › Research › peer-review
Open Access2 Citations (Scopus)1 Downloads (Pure)
Thesis
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Caracterització a escala nanomètrica de la degradació i ruptura dielèctrica del SiO2 en dispositius MOS mitjançant C-AFM
Porti Pujal, M. (Author), Aymerich Humet, X. (Director) & Nafría Maqueda, M. (Director), 4 Apr 2003Student thesis: Doctoral thesis