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  • 13 Citations
  • 2 h-Index
20172019

Research output per year

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Research Output

  • 13 Citations
  • 2 h-Index
  • 7 Article

Analysis and simulation of the multiple resistive switching modes occurring in HfO <inf>x</inf> -based resistive random access memories using memdiodes

Petzold, S., Miranda, E., Sharath, S. U., Muñoz-Gorriz, J., Vogel, T., Piros, E., Kaiser, N., Eilhardt, R., Zintler, A., Molina-Luna, L., Suñé, J. & Alff, L., 21 Jun 2019, In : Journal of Applied Physics. 125, 234503.

Research output: Contribution to journalArticleResearch

  • 4 Citations (Scopus)

    Assessing the correlation between location and size of catastrophic breakdown events in high-k mim capacitors

    Munoz-Gorriz, J., Blachier, D., Reimbold, G., Campabadal, F., Sune, J., Monaghan, S., Cherkaoui, K., Hurley, P. K. & Miranda, E., 1 Jun 2019, In : IEEE Transactions on Device and Materials Reliability. 19, p. 452-460 8715659.

    Research output: Contribution to journalArticleResearch

  • 1 Citation (Scopus)

    Detection of inhibitory effects in the generation of breakdown spots in HfO<inf>2</inf>-based MIM devices

    Muñoz-Gorriz, J., Monaghan, S., Cherkaoui, K., Suñé, J., Hurley, P. K. & Miranda, E., 15 Jul 2019, In : Microelectronic Engineering. 215, 111023.

    Research output: Contribution to journalArticleResearch

  • SPICE model for the current-voltage characteristic of resistive switching devices including the snapback effect

    Miranda, E., Muñoz-Gorriz, J., Suñe, J. & Fröhlich, K., 15 Jul 2019, In : Microelectronic Engineering. 215, 110998.

    Research output: Contribution to journalArticleResearch

  • 1 Citation (Scopus)

    A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory

    Rodriguez-Fernandez, A., Muñoz-Gorriz, J., Suñé, J. & Miranda, E., 1 Sep 2018, In : Microelectronics Reliability. 88-90, p. 142-146

    Research output: Contribution to journalArticleResearchpeer-review

  • 2 Citations (Scopus)