Projects per year
Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Collaborations and top research areas from the last five years
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Porti Pujal, M., Valdivieso Leon, C. A. & Claramunt Ruiz, S.
1/06/20 → 29/02/24
Project: Research Projects and Other Grants
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Beneficio del ruido en la respuesta de menrístores para el desarrollo de sistemas de computación alternativas y avanzadas.
Rodriguez Martinez, R., Crespo Yepes, A., Pedro Puig, M., Salvador Aguilera, E., Martin Martinez, J., Nafria Maqueda, M. & Rubio Solá, A.
1/11/18 → 30/09/21
Project: Research Projects and Other Grants
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Obleas para automoción y otras aplicaciones clave utilizando memorias integradas en microprocesadores ULSI
Suñe Tarruella, J. F., Boquet Pujadas, G., Lopez Vicario, J., Martin Martinez, J., Miranda Castellano, E. A., Morell Perez, A., Muñoz Gorriz, J. & Pedro Puig, M.
1/05/18 → 31/08/21
Project: Research Projects and Other Grants
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Rodriguez Martinez, R. & Pedreira Rincon, G.
30/12/16 → 29/06/21
Project: Research Projects and Other Grants
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Red Temática en Varibilidad en Nanoelectrónica
Nafria Maqueda, M., Couso Fontanillo, C., Diaz Fortuny, J., Rodríguez Fernández, A., Martin Martinez, J., Claramunt Ruiz, S., Pedro Puig, M., Porti Pujal, M. & Rodriguez Martinez, R.
1/12/14 → 30/11/17
Project: Research Projects and Other Grants
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Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
Martin-Martinez, J., Diaz-Fortuny, J., Saraza-Canflanca, P., Rodriguez, R., Castro-Lopez, R., Roca, E., Fernandez, F. V. & Nafria, M., 2023, Institute of Electrical and Electronics Engineers Inc. 9 p. (IEEE International Reliability Physics Symposium Proceedings; vol. 2023-March)Research output: Book/Report › Proceeding › Research › peer-review
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Impact of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs
Valdivieso, C., Crespo-Yepes, A., Miranda, R., Bernal, D., Martin-Martinez, J., Rodriguez, R. & Nafria, M., May 2023, In: SOLID-STATE ELECTRONICS. 203, 5 p., 108625.Research output: Contribution to journal › Article › Research › peer-review
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Random Telegraph Noise and Bias Temperature Instabilities statistical characterization of Ω-gate FDSOI devices at low voltages
Pedreira, G., Martin-Martinez, J., Crespo-Yepes, A., Amat, E., Rodriguez, R. & Nafria, M., Nov 2023, In: SOLID-STATE ELECTRONICS. 209, 4 p., 108735.Research output: Contribution to journal › Article › Research › peer-review
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Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices
Fernandez, F. V., Roca, E., Saraza, P., Martin-Martinez, J., Rodriguez, R., Nafria, M. & Castro-Lopez, R., 2023, Institute of Electrical and Electronics Engineers Inc. 4 p. (Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023)Research output: Book/Report › Proceeding › Research › peer-review
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CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging
Crespo-Yepes, A., Nasarre, C., Garsot, N., Martin-Martinez, J., Rodriguez, R., Barajas, E., Aragones, X., Mateo, D. & Nafria, M., May 2022, In: SOLID-STATE ELECTRONICS. 191, 8 p., 108264.Research output: Contribution to journal › Article › Research › peer-review
1 Citation (Scopus)
Thesis
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Modelado de los efectos de la ruptura dieléctrica, BTI y variabilidad en MOSFETs Ultraescalados para la simulaciójn de circuitos. (Mención Europea)
Author: Martín Martínez, J., 21 Jul 2009Supervisor: Nafría Maqueda, M. (Director)
Student thesis: Doctoral thesis