Projects per year
Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Dive into the research topics where Javier Martin Martinez is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Porti Pujal, M., Valdivieso Leon, C. A. & Claramunt Ruiz, S.
1/06/20 → 29/02/24
Project: Research Projects and Other Grants
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Beneficio del ruido en la respuesta de menrístores para el desarrollo de sistemas de computación alternativas y avanzadas.
Rodriguez Martinez, R., Crespo Yepes, A., Pedro Puig, M., Salvador Aguilera, E., Martin Martinez, J., Nafria Maqueda, M. & Rubio Solá, A.
1/11/18 → 30/09/21
Project: Research Projects and Other Grants
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Obleas para automoción y otras aplicaciones clave utilizando memorias integradas en microprocesadores ULSI
Suñe Tarruella, J. F., Boquet Pujadas, G., Lopez Vicario, J., Martin Martinez, J., Miranda Castellano, E. A., Morell Perez, A., Muñoz Gorriz, J. & Pedro Puig, M.
1/05/18 → 31/08/21
Project: Research Projects and Other Grants
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Rodriguez Martinez, R. & Pedreira Rincon, G.
30/12/16 → 29/06/21
Project: Research Projects and Other Grants
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Red Temática en Varibilidad en Nanoelectrónica
Nafria Maqueda, M., Couso Fontanillo, C., Diaz Fortuny, J., Rodríguez Fernández, A., Martin Martinez, J., Claramunt Ruiz, S., Pedro Puig, M., Porti Pujal, M. & Rodriguez Martinez, R.
1/12/14 → 30/11/17
Project: Research Projects and Other Grants
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Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
Martin-Martinez, J., Diaz-Fortuny, J., Saraza-Canflanca, P., Rodriguez, R., Castro-Lopez, R., Roca, E., Fernandez, F. V. & Nafria, M., 2023, Institute of Electrical and Electronics Engineers Inc. 9 p. (IEEE International Reliability Physics Symposium Proceedings; vol. 2023-March)Research output: Book/Report › Proceeding › Research › peer-review
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CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging
Crespo-Yepes, A., Nasarre, C., Garsot, N., Martin-Martinez, J., Rodriguez, R., Barajas, E., Aragones, X., Mateo, D. & Nafria, M., May 2022, In: SOLID-STATE ELECTRONICS. 191, 8 p., 108264.Research output: Contribution to journal › Article › Research › peer-review
1 Citation (Scopus) -
Comparison of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs
Valdivieso, C., Crespo-Yepes, A., Miranda, R., Bernal, D., Martin-Martinez, J., Rodriguez, R. & Nafria, M., Aug 2022, In: SOLID-STATE ELECTRONICS. 194, 4 p., 108324.Research output: Contribution to journal › Article › Research › peer-review
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Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs
Saraza-Canflanca, P., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M. & Fernandez, F. V., 1 Oct 2022, In: IEEE Transactions on Electron Devices. 69, 10, p. 5424-5429 6 p.Research output: Contribution to journal › Article › Research › peer-review
2 Citations (Scopus) -
On the Impact of the Biasing History on the Characterization of Random Telegraph Noise
Saraza-Canflanca, P., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M. & Fernandez, F. V., 2022, In: IEEE Transactions on Instrumentation and Measurement. 71, 9 p., 2003410.Research output: Contribution to journal › Article › Research › peer-review
Thesis
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Modelado de los efectos de la ruptura dieléctrica, BTI y variabilidad en MOSFETs Ultraescalados para la simulaciójn de circuitos. (Mención Europea)
Author: Martín Martínez, J., 21 Jul 2009Supervisor: Nafría Maqueda, M. (Director)
Student thesis: Doctoral thesis