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Dive into the research topics where Javier Martin Martinez is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R., Nafria Maqueda, M., Diaz Fortuny, J., Pedreira Rincon, G., Pedro Puig, M., Ruiz Flores, A., Salvador Aguilera, E., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J., Porti Pujal, M. & Valdivieso Leon, C. A.
1/06/20 → 31/05/23
Project: Research Projects and Other Grants
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Beneficio del ruido en la respuesta de menrístores para el desarrollo de sistemas de computación alternativas y avanzadas.
Rodriguez Martinez, R., Crespo Yepes, A., Pedro Puig, M., Salvador Aguilera, E., Martin Martinez, J., Nafria Maqueda, M. & Rubio Solá, A.
1/11/18 → 30/09/21
Project: Research Projects and Other Grants
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Obleas para automoción y otras aplicaciones clave utilizando memorias integradas en microprocesadores ULSI
Suñe Tarruella, J. F., Boquet Pujadas, G., Lopez Vicario, J., Martin Martinez, J., Miranda Castellano, E. A., Morell Perez, A., Muñoz Gorriz, J. & Pedro Puig, M.
1/05/18 → 31/08/21
Project: Research Projects and Other Grants
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Dispositivos, circuitos y arquitecturas fiables y de bajo consumo para iot
Nafria Maqueda, M., Porti Pujal, M., Diaz Fortuny, J., Pedro Puig, M., Ruiz Flores, A., Aymerich Humet, F. J., Crespo Yepes, A., Martin Martinez, J. & Rodriguez Martinez, R.
30/12/16 → 29/06/21
Project: Research Projects and Other Grants
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Aproximación multinivel al diseño orientado a la fiabilidad de circuitos integrados analógicos y digitales
Nafria Maqueda, M., Rodriguez Martinez, R., Crespo Yepes, A., Aymerich Humet, F. J., Martin Martinez, J. & Porti Pujal, M.
Ministerio de Economia y Competitividad (MINECO)
1/01/14 → 31/12/18
Project: Research Projects and Other Grants
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Aging in CMOS RF Linear Power Amplifiers: An Experimental Study
Nafria, M., Martin Martinez, J., Crespo Yepes, A., Rodriguez Martinez, R., Barajas, E., Mateo, D. & Aragones, X., 1 Feb 2021, In: IEEE Transactions on Microwave Theory and Techniques. 69, 2, p. 1453-1463 11 p., 9290396.Research output: Contribution to journal › Article › Research › peer-review
4 Citations (Scopus) -
Circuit reliability prediction: Challenges and solutions for the device time-dependent variability characterization roadblock
Nafria, M., Diaz-Fortuny, J., Saraza-Canflanca, P., Martin-Martinez, J., Roca, E., Castro-Lopez, R., Rodriguez, R., Martin-Lloret, P., Toro-Frias, A., Mateo, D., Barajas, E., Aragones, X. & Fernandez, F. V., 19 Apr 2021, In: LAEDC 2021 - IEEE Latin America Electron Devices Conference.Research output: Contribution to journal › Article › Research › peer-review
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Modeling of the degradation of CMOS inverters under pulsed stress conditions from ‘on-the-fly’ measurements
Crespo-Yepes, A., Ramos, R., Barajas, E., Aragones, X., Mateo, D., Martin-Martinez, J., Rodriguez, R. & Nafria, M., 1 Oct 2021, In: SOLID-STATE ELECTRONICS. 184, 7 p., 108094.Research output: Contribution to journal › Article › Research › peer-review
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Power-efficient noise-induced reduction of reram cell's temporal variability effects
Ntinas, V., Rubio, A., Sirakoulis, G. C., Aguilera, E. S., Pedro, M., Crespo-Yepes, A., Martin-Martinez, J., Rodriguez, R. & Nafria, M., 1 Apr 2021, In: IEEE Transactions on Circuits and Systems II: Express Briefs. 68, 4, p. 1378-1382 5 p., 4.Research output: Contribution to journal › Article › Research › peer-review
4 Citations (Scopus) -
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
Diaz-Fortuny, J., Saraza-Canflanca, P., Rodriguez, R., Martin-Martinez, J., Castro-Lopez, R., Roca, E., Fernandez, F. V. & Nafria, M., 1 Nov 2021, In: SOLID-STATE ELECTRONICS. 185, 108037.Research output: Contribution to journal › Article › Research › peer-review