Projects per year
Personal profile
Education/Academic qualification
Degree, Llicenciat, Universitat Autònoma de Barcelona (UAB)
Award Date: 1 Jan 2004
External positions
Becari, Transports Metropolitans de Barcelona (TMB)
15 Jan 2004 → 15 Sept 2004
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Dive into the research topics where Esteve Amat Bertran is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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Projects
- 2 Finished
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Variabilidad y fiabilidad en dispositivos electrónicos avanzados: de la nanoescala al circuito (VARENAC)
Nafria Maqueda, M. (Principal Investigator), Amat Bertran, E. (Investigator), Ayala Cintas, N. (Investigator), Aymerich Humet, F. J. (Investigator), Bayerl , A. (Investigator), Crespo Yepes, A. (Investigator), Iglesias Santiso, V. (Investigator), Lanza Martínez, M. (Investigator), Martin Martinez, J. (Investigator), Porti Pujal, M. (Investigator), Rodriguez Martinez, R. (Investigator), Velayudhan , V. (Investigator), Moras Albero, M. (Investigator), Maestro Izquierdo, M. (Investigator), Couso Fontanillo, C. (Investigator), Diaz Fortuny, J. (Others) & Claramunt Ruiz, S. (Investigator)
Spanish Ministry of Science and Innovation
1/01/11 → 31/12/14
Project: Research Projects and Other Grants
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Prestaciones y Fiabilidad de Dispositivos y Circuitos CMOS Nanoelectrónicos basados en Materiales Alternativos
Nafria Maqueda, M. (Principal Investigator), Martin Martinez, J. (Scholar), Aguilera Martínez, L. (Investigator), Amat Bertran, E. (Investigator), Aymerich Humet, F. J. (Investigator), Boix Gargallo, J. (Investigator), Lanza Martínez, M. (Investigator), Porti Pujal, M. (Investigator), Raul Fernandez Garcia (Investigator) & Rodriguez Martinez, R. (Investigator)
Ministerio de Educación y Ciencia (MEC)
1/10/07 → 30/09/10
Project: Research Projects and Other Grants
Research output
- 13 Article
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Random Telegraph Noise and Bias Temperature Instabilities statistical characterization of Ω-gate FDSOI devices at low voltages
Pedreira, G., Martin-Martinez, J., Crespo-Yepes, A., Amat, E., Rodriguez, R. & Nafria, M., Nov 2023, In: SOLID-STATE ELECTRONICS. 209, 4 p., 108735.Research output: Contribution to journal › Article › Research › peer-review
Open Access1 Downloads (Pure) -
A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics
Amat, E., Kauerauf, T., Rodriguez, R., Nafria, M., Aymerich, X., Degraeve, R. & Groeseneken, G., 1 Jan 2013, In: Microelectronic Engineering. 103, p. 144-149Research output: Contribution to journal › Article › Research › peer-review
18 Citations (Scopus) -
Gate voltage influence on the channel hot-carrier degradation of high-κ-Based Devices
Amat, E., Kauerauf, T., Degraeve, R., Rodríguez, R., Nafria, M., Aymerich, X. & Groeseneken, G., 1 Mar 2011, In: IEEE Transactions on Device and Materials Reliability. 11, 1, p. 92-97 5638616.Research output: Contribution to journal › Article › Research › peer-review
16 Citations (Scopus) -
Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack
Amat, E., Kauerauf, T., Degraeve, R., Rodríguez, R., Nafría, M., Aymerich, X. & Groeseneken, G., 1 Jan 2010, In: Microelectronic Engineering. 87, p. 47-50Research output: Contribution to journal › Article › Research › peer-review
36 Citations (Scopus) -
Channel-hot-carrier degradation and bias temperature instabilities in CMOS inverters
Martín-Martínez, J., Gerardin, S., Amat, E., Rodríguez, R., Nafría, M., Aymerich, X., Paccagnella, A. & Ghidini, G., 7 Sept 2009, In: IEEE Transactions on Electron Devices. 56, p. 2155-2159Research output: Contribution to journal › Article › Research › peer-review
22 Citations (Scopus)
Thesis
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Degradació del stack dielèctric SiO2/high-K: BTI i portadors calents
Amat Bertran, E. (Author), Rodríguez Martínez, R. (Director), 10 Dec 2009Student thesis: Doctoral thesis