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Dive into the research topics where Optical Metrology & Image Processing Laboratory (MIP-OptiLab) is active. These topic labels come from the works of this organisation's members. Together they form a unique fingerprint.
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Projects
- 1 Active
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DESARROLLO DE INSTRUMENTACION POLARIMETRICA AVANZADA PARA LA CARACTERIZACION DE MATERIALES Y TEJIDOS; Y METROLOGIA DE SUPERFICIES POR DEFLECTOMETRIA
Campos Coloma, J. I. P., Lizana Tutusaus, A., Márquez Ruiz, A. & Yzuel Gimenez, J.
Ministerio de Economia y Competitividad (MINECO)
1/01/19 → 31/12/21
Project
Research output
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Misalignment error analysis in polychromatic division of focal plane Stokes polarimeters
Lizana, A., Campos, J., Van Eeckhout, A. & Marquez, A., 15 May 2019, In : OSA Continuum. 2, 5, p. 1565-1575 11 p.Research output: Contribution to journal › Article › Research › peer-review
1 Citation (Scopus) -
Wavefront imaging by using an inline holographic microscopy system based on a double-sideband filter
Zhang, H., Monroy-Ramírez, F. A., Lizana, A., Iemmi, C., Bennis, N., Morawiak, P., Piecek, W. & Campos, J., 1 Feb 2019, In : Optics and Lasers in Engineering. 113, p. 71-76Research output: Contribution to journal › Article › Research
3 Citations (Scopus) -
LCoS display phase self-calibration method based on diffractive lens schemes
Zhang, H., Lizana, A., Iemmi, C., Monroy-Ramírez, F. A., Márquez, A., Moreno, I. & Campos, J., 1 Jul 2018, In : Optics and Lasers in Engineering. 106, p. 147-154Research output: Contribution to journal › Article › Research › peer-review
9 Citations (Scopus)