Research output per year
Research output per year
- 17 results
Search results
-
2023
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
Martin-Martinez, J., Diaz-Fortuny, J., Saraza-Canflanca, P., Rodriguez, R., Castro-Lopez, R., Roca, E., Fernandez, F. V. & Nafria, M., 2023, Institute of Electrical and Electronics Engineers Inc. 9 p. (IEEE International Reliability Physics Symposium Proceedings; vol. 2023-March)Research output: Book/Report › Proceeding › Research › peer-review
Open Access2 Citations (Scopus)1 Downloads (Pure) -
Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices
Fernandez, F. V., Roca, E., Saraza, P., Martin-Martinez, J., Rodriguez, R., Nafria, M. & Castro-Lopez, R., 2023, Institute of Electrical and Electronics Engineers Inc. 4 p. (Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023)Research output: Book/Report › Proceeding › Research › peer-review
Open Access1 Downloads (Pure) -
2022
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation
Saraza-Canflanca, P., Martin-Martinez, J., Roca, E., Castro-Lopez, R., Rodriguez, R., Nafria, M. & Fernandez, F. V., 2022, Institute of Electrical and Electronics Engineers Inc. 4 p. (Proceedings - 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022)Research output: Book/Report › Proceeding › Research › peer-review
Open Access2 Downloads (Pure) -
Beneficial Role of Noise in Hf-based Memristors
Rodriguez, R., Martin-Martinez, J., Salvador, E., Crespo-Yepes, A., Miranda, E., Nafria, M., Rubio, A., Ntinas, V. & Sirakoulis, G. C., 2022, Institute of Electrical and Electronics Engineers Inc. 5 p. (Proceedings - IEEE International Symposium on Circuits and Systems; vol. 2022-May)Research output: Book/Report › Proceeding › Research › peer-review
Open Access8 Citations (Scopus)1 Downloads (Pure) -
Exploiting the ambipolarity in emerging transistors for high-frequency applications
Pacheco-Sanchez, A., Ramos-Silva, J. N., Mavredakis, N., Ramirez-Garcia, E. & Jimenez, D., 16 Nov 2022, Institute of Electrical and Electronics Engineers Inc. (DCIS 2022 - Proceedings of the 37th Conference on Design of Circuits and Integrated Systems)Research output: Book/Report › Proceeding › Research › peer-review
3 Citations (Scopus) -
Lumped model-based analysis of hBN RF switches
Jordan-Garcia, O., Ramirez-Garcia, E., Jimenez, D. & Pacheco-Sanchez, A., 4 Jul 2022, Institute of Electrical and Electronics Engineers Inc. (2022 IEEE Latin America Electron Devices Conference, LAEDC 2022)Research output: Book/Report › Proceeding › Research › peer-review
1 Citation (Scopus) -
Stochastic resonance effect in binary STDP performed by RRAM devices
Salvador, E., Rodriguez, R., Martin-Martinez, J., Crespo-Yepes, A., Miranda, E., Nafria, M., Rubio, A., Ntinas, V. & Sirakoulis, G. C., Nov 2022, 4 p. (Proceedings of the IEEE Conference on Nanotechnology; vol. 2022-July)Research output: Book/Report › Proceeding › Research › peer-review
Open Access2 Citations (Scopus)4 Downloads (Pure) -
2020
Schottky barrier height extraction of multi-channel one-dimensional FETs
Pacheco Sanchez, A. U., Ramirez-Garcia, E., Enciso-Aguilar, M. A. & Jimenez Jimenez, D., 25 Feb 2020, 5 p. (2020 IEEE Latin America Electron Devices Conference (LAEDC))Research output: Book/Report › Proceeding › Research › peer-review
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2018
Carbon nanotube Schottky diodes performance study: static and high-frequency characteristics
Macedo-Zamudio, H., Pacheco-Sanchez, A., Ramirez-Garcia, E., Rodriguez-Mendez, L. M., Valdez-Perez, D. & Schroter, M., 7 Nov 2018, 6 p. (2018 Nanotechnology for Instrumentation and Measurement (NANOfIM))Research output: Book/Report › Proceeding › Research › peer-review
1 Citation (Scopus) -
2016
Carbon nanotube field-effect transistor performance in the scope of the 2026 ITRS requirements
Pacheco-Sanchez, A., Loroch, D., Mothes, S., Schroter, M. & Claus, M., 6 Sept 2016, 4 p. (2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD))Research output: Book/Report › Proceeding › Research › peer-review
3 Citations (Scopus) -
2015
Contact resistance extraction methods for CNTFETs
Pacheco-Sanchez, A., Mothes, S., Claus, M. & SchrOter, M., 14 Sept 2015, 4 p. (2015 45th European Solid State Device Research Conference (ESSDERC))Research output: Book/Report › Proceeding › Research › peer-review
4 Citations (Scopus) -
Multi-scale modeling of metal-CNT interfaces
Claus, M., Fediai, A., Mothes, S., Pacheco-Sanchez, A., Ryndyk, D., Blawid, S., Cuniberti, G. & Schroter, M., 2 Sept 2015, 2 p. (2015 International Workshop on Computational Electronics (IWCE))Research output: Book/Report › Proceeding › Research › peer-review
2 Citations (Scopus) -
2014
Hysteresis-free carbon nanotube field-effect transistors without passivation
Tittmann, J., Hermann, S., Schulz, S. E., Pacheco-Sanchez, A., Claus, M., Schröter, M. & Schulz, S. E., 8 Jul 2014, 2 p. (2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH))Research output: Book/Report › Proceeding › Research › peer-review
8 Citations (Scopus) -
Trap-induced apparent linearity of CNTFETs
Haferlach, M., Claus, M., Nardmann, T., Pacheco-Sanchez, A., Sakalas, P. & Schröter, M., 15 Jun 2014, 512 p.Research output: Book/Report › Proceeding › Research › peer-review
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2013
High-frequency benchmark circuit design for a sub 50 nm CNTFET technology
Claus, M., Mukherjee, A., Moroguma, A., Pacheco, A., Blawid, S. & Schroter, M., 4 Aug 2013, 5 p. (2013 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference (IMOC))Research output: Book/Report › Proceeding › Research › peer-review
3 Citations (Scopus) -
2011
Modeling high-frequency noise behavior in a SiGe Heterojunction Bipolar Transistor for different bias
Pacheco-Sanchez, A., Enciso-Aguilar, M., Rodriguez-Mendez, L. & Ramirez-Garcia, E., 29 Oct 2011, 4 p.Research output: Book/Report › Proceeding › Research › peer-review
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2010
Full comparison between analytical results, electrical modeling and measurements for the noise behavior of a SiGe HBT
Pacheco-Sanchez, A., Enciso-Aguilar, M. & Rodriguez-Mendez, L., 15 Sept 2010, 5 p.Research output: Book/Report › Proceeding › Research › peer-review
1 Citation (Scopus)