Description
This dataset contains the Optical images obtained on different MIM devices after inducing multiple Dielectric Breakdown (BD) events of the gate dielectric. The images were taken under different conditions in order to evaluate their suitability as entropy source for the implementation of Physical Unclonable Funtions (PUF) in security applications. The dataset corresponds to the raw images, without any type of processing.
| Date made available | 20 Nov 2025 |
|---|---|
| Publisher | CORA.Repositori de Dades de Recerca |
| Date of data production | 2022 |
Projects
- 1 Finished
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THE VARIABILITY CHALLENGE IN NANO-CMOS AND BEYOND-CMOS: HARNESSING DEVICES AND MATERIALS FOR MITIGATION AND EXPLOITATION (VIGILANT-UAB)
Rodriguez Martinez, R. (Principal Investigator), Nafria Maqueda, M. (Co-Investigador/a Principal), Diaz Fortuny, J. (Collaborator), Pedreira Rincon, G. (Collaborator), Pedro Puig, M. (Collaborator), Ruiz Flores, A. (Collaborator), Salvador Aguilera, E. (Collaborator), Aymerich Humet, F. J. (Investigator), Crespo Yepes, A. (Investigator), Martin Martinez, J. (Investigator), Porti Pujal, M. (Investigator), Valdivieso Leon, C. A. (Collaborator) & Claramunt Ruiz, S. (Collaborator)
1/06/20 → 29/02/24
Project: Research Projects and Other Grants
Research output
- 1 Article
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Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions
Porti, M., Redon, M., Munoz, J., Nafria, M. & Miranda, E., Oct 2023, In: IEEE Electron Device Letters. 44, 10, p. 1600-1603 4 p.Research output: Contribution to journal › Article › Research › peer-review
Open Access6 Link opens in a new tab Citations (Scopus)1 Downloads (Pure)
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