Keyphrases
Parameter Extraction
100%
GPU-based
100%
Bias Temperature Instability
100%
Time Lag Plot
100%
Defect Parameters
100%
MOSFET
23%
Variability Modeling
23%
Circuit Simulation
15%
Induced Degradation
15%
Modeling Bias
15%
Device Geometry
7%
Bivariate
7%
Measurement Setup
7%
Random Telegraph Noise
7%
Emission Time
7%
SPICE Model
7%
Unique Behaviour
7%
Lognormal
7%
Defect Distribution
7%
Stress Pattern
7%
Measure Data
7%
Instability Model
7%
Voltage Step
7%
Massive Parallelism
7%
Capture Time
7%
Computationally Intensive
7%
Accurate Characterization
7%
Correlated Noise
7%
Device Features
7%
Vth Shift
7%
Graphics Card
7%
MOSFET Device
7%
Degradation Behavior
7%
Characterization Challenges
7%
Instability Behavior
7%
Parallel Measurements
7%
Shrinking Device
7%
Defect Extraction
7%
Geometry Modeling
7%
Voltage Noise
7%
Computer Science
Variability Model
100%
Circuit Simulation
100%
Graphics Processing Unit
100%
Parallelism
33%
Model Instability
33%
Processing Core
33%
Correlated Noises
33%
Parallel Measurement
33%
Representative Set
33%
Measurement Data
33%
Engineering
Graphics Processing Unit
100%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Circuit Simulation
75%
Induced Degradation
50%
Measurement Setup
25%
SPICE
25%
Acquired Data
25%
Representative Set
25%
Measurement Data
25%
Graphic Card
25%
Parallelism
25%
Noise Voltage
25%