TY - JOUR
T1 - Two-dimensional graphene with structural defects: Elastic mean free path, minimum conductivity, and anderson transition
AU - Lherbier, Aurélien
AU - Dubois, Simon M.M.
AU - Declerck, Xavier
AU - Roche, Stephan
AU - Niquet, Yann Michel
AU - Charlier, Jean Christophe
PY - 2011/1/25
Y1 - 2011/1/25
N2 - Quantum transport properties of disordered graphene with structural defects (Stone-Wales and divacancies) are investigated using a realistic π-π* tight-binding model elaborated from ab initio calculations. Mean free paths and semiclassical conductivities are then computed as a function of the nature and density of defects (using an order-N real-space Kubo-Greenwood method). By increasing the defect density, the decay of the semiclassical conductivities is predicted to saturate to a minimum value of 4e2/πh over a large range (plateau) of carrier density (>0. 5×1014cm-2). Additionally, strong contributions of quantum interferences suggest that the Anderson localization regime could be experimentally measurable for a defect density as low as 1%. © 2011 American Physical Society.
AB - Quantum transport properties of disordered graphene with structural defects (Stone-Wales and divacancies) are investigated using a realistic π-π* tight-binding model elaborated from ab initio calculations. Mean free paths and semiclassical conductivities are then computed as a function of the nature and density of defects (using an order-N real-space Kubo-Greenwood method). By increasing the defect density, the decay of the semiclassical conductivities is predicted to saturate to a minimum value of 4e2/πh over a large range (plateau) of carrier density (>0. 5×1014cm-2). Additionally, strong contributions of quantum interferences suggest that the Anderson localization regime could be experimentally measurable for a defect density as low as 1%. © 2011 American Physical Society.
U2 - 10.1103/PhysRevLett.106.046803
DO - 10.1103/PhysRevLett.106.046803
M3 - Article
SN - 0031-9007
VL - 106
JO - Physical Review Letters
JF - Physical Review Letters
IS - 4
M1 - 046803
ER -