TY - JOUR
T1 - The new FAST module :
T2 - a portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes
AU - Dri, Carlo
AU - Panighel, Mirco
AU - Tiemann, Daniel
AU - Patera, Laerte L.
AU - Troiano, Giulia
AU - Fukamori, Yves
AU - Knoller, Fabian
AU - Lechner, Barbara A. J.
AU - Cautero, Giuseppe
AU - Giuressi, Dario
AU - Comelli, Giovanni
AU - Fraxedas, Jordi
AU - Africh, Cristina
AU - Esch, Friedrich
PY - 2019
Y1 - 2019
N2 - Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e.g. surface diffusion, film growth, self-assembly and chemical reactions) cannot be thoroughly addressed by conventional SPMs. To overcome this limitation, several years ago we developed a first prototype of the FAST module, an add-on instrument capable of driving a commercial scanning tunneling microscope (STM) at and beyond video rate frequencies. Here we report on a fully redesigned version of the FAST module, featuring improved performance and user experience, which can be used both with STMs and atomic force microscopes (AFMs), and offers additional capabilities such as an atom tracking mode. All the new features of the FAST module, including portability between different commercial instruments, are described in detail and practically demonstrated.
AB - Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e.g. surface diffusion, film growth, self-assembly and chemical reactions) cannot be thoroughly addressed by conventional SPMs. To overcome this limitation, several years ago we developed a first prototype of the FAST module, an add-on instrument capable of driving a commercial scanning tunneling microscope (STM) at and beyond video rate frequencies. Here we report on a fully redesigned version of the FAST module, featuring improved performance and user experience, which can be used both with STMs and atomic force microscopes (AFMs), and offers additional capabilities such as an atom tracking mode. All the new features of the FAST module, including portability between different commercial instruments, are described in detail and practically demonstrated.
UR - https://www.scopus.com/pages/publications/85067575323
U2 - 10.1016/j.ultramic.2019.05.010
DO - 10.1016/j.ultramic.2019.05.010
M3 - Article
SN - 0304-3991
VL - 205
SP - 49
EP - 56
JO - Ultramicroscopy
JF - Ultramicroscopy
ER -