TY - BOOK
T1 - TARS: A toolbox for statistical reliability modeling of CMOS devices
AU - Diaz-Fortuny, J.
AU - Martin-Martinez, J.
AU - Rodriguez, R.
AU - Nafria, M.
AU - Castro-Lopez, R.
AU - Roca, E.
AU - Fernandez, F.V.
PY - 2017
Y1 - 2017
N2 - This paper presents a toolbox for the automation of the electrical characterization of CMOS transistors. The developed software provides a user-friendly interface to carry out different tests to evaluate time-zero (i.e., process) and time-dependent variability in CMOS devices. Also, the software incorporates a post-processing capability that allows users to visualize the data. Moreover, without loss of generality, the toolbox allows the user, from the measured data, to feed a particular physics-based model that accounts for various aging phenomena
AB - This paper presents a toolbox for the automation of the electrical characterization of CMOS transistors. The developed software provides a user-friendly interface to carry out different tests to evaluate time-zero (i.e., process) and time-dependent variability in CMOS devices. Also, the software incorporates a post-processing capability that allows users to visualize the data. Moreover, without loss of generality, the toolbox allows the user, from the measured data, to feed a particular physics-based model that accounts for various aging phenomena
UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-85027511337&partnerID=MN8TOARS
U2 - 10.1109/SMACD.2017.7981601
DO - 10.1109/SMACD.2017.7981601
M3 - Proceeding
SN - 978-1-5090-5053-6
BT - TARS: A toolbox for statistical reliability modeling of CMOS devices
ER -