Successive oxide breakdown statistics: Correlation effects, reliability methodologies, and their limits

Keyphrases

• Reliability Methodology 100%
• Breakdown Statistics 100%
• Correlation Effects 100%
• Oxide Breakdown 100%
• Successive Events 50%
• MOS Devices 50%
• Failure Criterion 50%
• Current Jump 50%
• Breakdown Path 50%
• Breakdown Current 50%
• Reliability Assessment 50%
• Chip Reliability 50%
• Successive Breakdown 50%
• Lateral Propagation 50%
• Breakdown Theory 50%

Engineering

• Failure Criterion 100%
• Reliability Assessment 100%
• Lateral Propagation 100%