Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices

F. V. Fernandez; E. Roca; P. Saraza; J. Martin-Martinez; R. Rodriguez; M. Nafria; R. Castro-Lopez

doi:10.1109/SMACD58065.2023.10192206

Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices

F. V. Fernandez, E. Roca, P. Saraza, J. Martin-Martinez, R. Rodriguez, M. Nafria, R. Castro-Lopez

Producció científica: LLibre/informe › Llibre d'Actes › Recerca › Avaluat per experts

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Resum

Time-dependent variability phenomena are stochastic and discrete for nanometer-scale technologies, and, hence, must be statistically characterized. These phenomena are attributed to the emission and capture of charges in device defects. This paper explores two different strategies to extract, from experimental data, the distribution parameters of the time constants of the defects. It delves into the accuracy of each strategy, showing how the extraction strategy can have a huge impact on the accuracy and the amount of characterization data required, and, therefore, on the amount of (expensive) characterization time in the lab.

Idioma original	Anglès
Editor	Institute of Electrical and Electronics Engineers Inc.
Nombre de pàgines	4
ISBN (electrònic)	9798350332650
ISBN (imprès)	9798350332650
DOIs	https://doi.org/10.1109/SMACD58065.2023.10192206
Estat de la publicació	Publicada - 2023

Sèrie de publicacions

Nom	Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023

Accés al document

10.1109/SMACD58065.2023.10192206

https://ddd.uab.cat/record/291513

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Fernandez, F. V., Roca, E., Saraza, P., Martin-Martinez, J., Rodriguez, R., Nafria, M., & Castro-Lopez, R. (2023). Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices. (Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/SMACD58065.2023.10192206

Fernandez, F. V. ; Roca, E. ; Saraza, P. et al. / Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices. Institute of Electrical and Electronics Engineers Inc., 2023. 4 pàg. (Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023).

@book{4a8da6eab2e5487486a9ffe0a0a2ed0c,

title = "Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices",

abstract = "Time-dependent variability phenomena are stochastic and discrete for nanometer-scale technologies, and, hence, must be statistically characterized. These phenomena are attributed to the emission and capture of charges in device defects. This paper explores two different strategies to extract, from experimental data, the distribution parameters of the time constants of the defects. It delves into the accuracy of each strategy, showing how the extraction strategy can have a huge impact on the accuracy and the amount of characterization data required, and, therefore, on the amount of (expensive) characterization time in the lab.",

keywords = "characterization, modeling, parameter extraction, time-dependent variability",

author = "Fernandez, \{F. V.\} and E. Roca and P. Saraza and J. Martin-Martinez and R. Rodriguez and M. Nafria and R. Castro-Lopez",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.",

year = "2023",

doi = "10.1109/SMACD58065.2023.10192206",

language = "English",

isbn = "9798350332650",

series = "Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

}

Fernandez, FV, Roca, E, Saraza, P, Martin-Martinez, J , Rodriguez, R , Nafria, M & Castro-Lopez, R 2023, Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices. Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023, Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/SMACD58065.2023.10192206

Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices. / Fernandez, F. V.; Roca, E.; Saraza, P. et al.
Institute of Electrical and Electronics Engineers Inc., 2023. 4 pàg. (Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023).

Producció científica: LLibre/informe › Llibre d'Actes › Recerca › Avaluat per experts

TY - BOOK

T1 - Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices

AU - Fernandez, F. V.

AU - Roca, E.

AU - Saraza, P.

AU - Martin-Martinez, J.

AU - Rodriguez, R.

AU - Nafria, M.

AU - Castro-Lopez, R.

PY - 2023

Y1 - 2023

N2 - Time-dependent variability phenomena are stochastic and discrete for nanometer-scale technologies, and, hence, must be statistically characterized. These phenomena are attributed to the emission and capture of charges in device defects. This paper explores two different strategies to extract, from experimental data, the distribution parameters of the time constants of the defects. It delves into the accuracy of each strategy, showing how the extraction strategy can have a huge impact on the accuracy and the amount of characterization data required, and, therefore, on the amount of (expensive) characterization time in the lab.

AB - Time-dependent variability phenomena are stochastic and discrete for nanometer-scale technologies, and, hence, must be statistically characterized. These phenomena are attributed to the emission and capture of charges in device defects. This paper explores two different strategies to extract, from experimental data, the distribution parameters of the time constants of the defects. It delves into the accuracy of each strategy, showing how the extraction strategy can have a huge impact on the accuracy and the amount of characterization data required, and, therefore, on the amount of (expensive) characterization time in the lab.

KW - characterization

KW - modeling

KW - parameter extraction

KW - time-dependent variability

UR - https://www.scopus.com/pages/publications/85168691886

U2 - 10.1109/SMACD58065.2023.10192206

DO - 10.1109/SMACD58065.2023.10192206

M3 - Proceeding

AN - SCOPUS:85168691886

SN - 9798350332650

T3 - Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023

BT - Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Fernandez FV, Roca E, Saraza P, Martin-Martinez J , Rodriguez R , Nafria M et al. Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices. Institute of Electrical and Electronics Engineers Inc., 2023. 4 pàg. (Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023). doi: 10.1109/SMACD58065.2023.10192206

Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices

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