Stochastic modeling of progressive breakdown in ultrathin SiO2 films

E. Miranda; A. Cester; A. Paccagnella

doi:10.1063/1.1634372

Stochastic modeling of progressive breakdown in ultrathin SiO₂ films

E. Miranda^*, A. Cester, A. Paccagnella

^*Autor corresponent d’aquest treball

Departament d'Enginyeria Electrònica

Producció científica: Contribució a revista › Article › Recerca › Avaluat per experts

5 Cites (Scopus)

Resum

Progressive breakdown dynamics of ultrathin SiO₂ films is described by the stochastic logistic differential equation. For completeness, particular breakdown cases corresponding to reverting processes are also included.

Idioma original	Anglès
Pàgines (de-a)	5014-5016
Nombre de pàgines	3
Revista	Applied physics letters
Volum	83
Número	24
DOIs	https://doi.org/10.1063/1.1634372
Estat de la publicació	Publicada - 15 de des. 2003

Accés al document

10.1063/1.1634372

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Com citar-ho

@article{fd5736ee0077492ca7ad941fbe68c3e4,

title = "Stochastic modeling of progressive breakdown in ultrathin SiO2 films",

abstract = "Progressive breakdown dynamics of ultrathin SiO2 films is described by the stochastic logistic differential equation. For completeness, particular breakdown cases corresponding to reverting processes are also included.",

author = "E. Miranda and A. Cester and A. Paccagnella",

year = "2003",

month = dec,

day = "15",

doi = "10.1063/1.1634372",

language = "English",

volume = "83",

pages = "5014--5016",

journal = "Applied physics letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "24",

}

TY - JOUR

T1 - Stochastic modeling of progressive breakdown in ultrathin SiO2 films

AU - Miranda, E.

AU - Cester, A.

AU - Paccagnella, A.

PY - 2003/12/15

Y1 - 2003/12/15

N2 - Progressive breakdown dynamics of ultrathin SiO2 films is described by the stochastic logistic differential equation. For completeness, particular breakdown cases corresponding to reverting processes are also included.

AB - Progressive breakdown dynamics of ultrathin SiO2 films is described by the stochastic logistic differential equation. For completeness, particular breakdown cases corresponding to reverting processes are also included.

UR - https://www.scopus.com/pages/publications/0346503157

U2 - 10.1063/1.1634372

DO - 10.1063/1.1634372

M3 - Article

AN - SCOPUS:0346503157

SN - 0003-6951

VL - 83

SP - 5014

EP - 5016

JO - Applied physics letters

JF - Applied physics letters

IS - 24