SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors

E. Amat; M.B. Gonzalez; P. Verheyen; R. Rodríguez; M. Nafria; X. Aymerich; E. Simoen; Javier Martin Martinez

doi:10.1016/j.microrel.2010.07.150

SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors

E. Amat, M.B. Gonzalez, P. Verheyen, R. Rodríguez, M. Nafria, X. Aymerich, E. Simoen, Javier Martin Martinez

Departament d'Enginyeria Electrònica

Producció científica: Contribució a revista › Article › Recerca

Idioma original	Anglès
Pàgines (de-a)	1263-1266
Revista	Microelectronics Reliability
Volum	50
DOIs	https://doi.org/10.1016/j.microrel.2010.07.150
Estat de la publicació	Publicada - 1 de gen. 2010

Accés al document

10.1016/j.microrel.2010.07.150

Altres arxius i enllaços

https://www.scopus.com/pages/publications/77956530746

Com citar-ho

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title = "SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors",

author = "E. Amat and M.B. Gonzalez and P. Verheyen and R. Rodr{\'i}guez and M. Nafria and X. Aymerich and E. Simoen and \{Martin Martinez\}, Javier",

year = "2010",

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doi = "10.1016/j.microrel.2010.07.150",

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volume = "50",

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journal = "Microelectronics Reliability",

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AU - Amat, E.

AU - Gonzalez, M.B.

AU - Verheyen, P.

AU - Rodríguez, R.

AU - Nafria, M.

AU - Aymerich, X.

AU - Simoen, E.

AU - Martin Martinez, Javier

PY - 2010/1/1

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UR - https://www.scopus.com/pages/publications/77956530746

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DO - 10.1016/j.microrel.2010.07.150

M3 - Article

SN - 0026-2714

VL - 50

SP - 1263

EP - 1266

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -