Resum
Since the first liquid crystal displays (LCDs) at the beginning of the seventies—based on the twisted-nematic cell configuration [1]—LC-based devices [2] have shown a great potential not only as a display technology, but also for spatial light modulation applications.
Among the different LC-based technologies, liquid crystal on silicon (LCoS) has become one of the most widespread technologies for spatial light modulation in optics and photonics’ applications [3,4,5,6]. These reflective microdisplays are composed of a high-performance silicon complementary metal oxide semiconductor (CMOS) backplane, which controls the liquid crystal layer’s light modulating properties . State-of-the-art LCoS microdisplays may exhibit a very small pixel pitch (below 4 μm), a very large number of pixels (resolutions larger than 4 K), and high fill factors (larger than 90%). They modulate illumination sources covering the UV, visible, and IR.
LCoS technologies are used as displays as well as polarization, amplitude, and phase-only spatial light modulators, where they achieve full phase modulation. Due to their excellent modulating properties and high degree of flexibility, they are found in all sorts of spatial light modulation applications, such as in LCoS-based display systems for augmented and virtual reality, head-up display, head-mounted display, projector, true holographic displays, digital holography, optical storage, adaptive optics, diffractive optical elements, super-resolution optical systems, optical metrology techniques, reconfigurable interconnects, beam-steering devices, wavelength selective switches in optical telecommunications, wave-front sensing of structured light beams, holographic optical traps, or quantum optical computing.
In order to fulfill the requirements in this extensive range of applications, specific models and characterization techniques are proposed. These devices may exhibit a number of degradation effects such as limited modulation range for high spatial frequency image content, interpixel cross-talk and fringing field, and time flicker, which may also depend on the analog or digital backplane of the corresponding LCoS device. Appropriate characterization and compensation techniques are then necessary.
Among the different LC-based technologies, liquid crystal on silicon (LCoS) has become one of the most widespread technologies for spatial light modulation in optics and photonics’ applications [3,4,5,6]. These reflective microdisplays are composed of a high-performance silicon complementary metal oxide semiconductor (CMOS) backplane, which controls the liquid crystal layer’s light modulating properties . State-of-the-art LCoS microdisplays may exhibit a very small pixel pitch (below 4 μm), a very large number of pixels (resolutions larger than 4 K), and high fill factors (larger than 90%). They modulate illumination sources covering the UV, visible, and IR.
LCoS technologies are used as displays as well as polarization, amplitude, and phase-only spatial light modulators, where they achieve full phase modulation. Due to their excellent modulating properties and high degree of flexibility, they are found in all sorts of spatial light modulation applications, such as in LCoS-based display systems for augmented and virtual reality, head-up display, head-mounted display, projector, true holographic displays, digital holography, optical storage, adaptive optics, diffractive optical elements, super-resolution optical systems, optical metrology techniques, reconfigurable interconnects, beam-steering devices, wavelength selective switches in optical telecommunications, wave-front sensing of structured light beams, holographic optical traps, or quantum optical computing.
In order to fulfill the requirements in this extensive range of applications, specific models and characterization techniques are proposed. These devices may exhibit a number of degradation effects such as limited modulation range for high spatial frequency image content, interpixel cross-talk and fringing field, and time flicker, which may also depend on the analog or digital backplane of the corresponding LCoS device. Appropriate characterization and compensation techniques are then necessary.
| Idioma original | Anglès |
|---|---|
| Número d’article | 9(15) |
| Nombre de pàgines | 4 |
| Revista | Applied Sciences (Switzerland) |
| Volum | 9 |
| Número | 15 |
| DOIs | |
| Estat de la publicació | Publicada - de jul. 2019 |