TY - JOUR
T1 - Scanning probe microscopies for analytical studies at the nanometer scale
AU - Esplandiu Egido, Maria José
PY - 2005
Y1 - 2005
N2 - The scanning probe microscopies (SPM) have transformed the way of studying the structure and the properties of a wide variety of systems. Without doubt, they have exerted a pivotal role in many scientific disciplines like physics, chemistry, biology and engineering and have helped to give birth to novel fields such as the nanoscience and nanotechnology. This review attempts to highlight the versatility and high sensitivity of these techniques for capturing analytical information at the nanometer scale. In this context we will provide a survey of scanning probe evolution from the capabilities to image topography, atomic/molecular structure and in-situ dynamic processes to the mapping or local probing of physical and chemical properties. A selection of illustrative SPM studies is presented covering several areas of science.
AB - The scanning probe microscopies (SPM) have transformed the way of studying the structure and the properties of a wide variety of systems. Without doubt, they have exerted a pivotal role in many scientific disciplines like physics, chemistry, biology and engineering and have helped to give birth to novel fields such as the nanoscience and nanotechnology. This review attempts to highlight the versatility and high sensitivity of these techniques for capturing analytical information at the nanometer scale. In this context we will provide a survey of scanning probe evolution from the capabilities to image topography, atomic/molecular structure and in-situ dynamic processes to the mapping or local probing of physical and chemical properties. A selection of illustrative SPM studies is presented covering several areas of science.
KW - Microscòpia de sonda de rastreig
KW - SPM
KW - Microscòpia de força atòmica
KW - AFM
KW - Microscòpia d'efecte túnel
KW - STM
KW - Espectroscòpia de força
KW - Mètodes d'anàlisi local
KW - Scanning probe microscopies
KW - Atomic force microscopy
KW - Scanning tunneling microscopy
KW - Force spectroscopy
KW - Local probe-based methods
M3 - Article
SN - 1575-6343
VL - 3
SP - 33
EP - 46
JO - Contributions to Science.
JF - Contributions to Science.
IS - 1
ER -