On the three-dimensional scanning tunneling microscopy formalism

N. Barniol, F. Pérez, X. Aymerich

Producció científica: Contribució a revista › Article › Recerca

Idioma original	Anglès
Pàgines (de-a)	483-487
Revista	Journal of vacuum science & technology. B, Microelectronics processing and phenomena
Volum	9
DOIs	https://doi.org/10.1116/1.585551
Estat de la publicació	Publicada - 1 de gen. 1991

Accés al document

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title = "On the three-dimensional scanning tunneling microscopy formalism",

author = "N. Barniol and F. P{\'e}rez and X. Aymerich",

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AU - Barniol, N.

AU - Pérez, F.

AU - Aymerich, X.

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JO - Journal of vacuum science & technology. B, Microelectronics processing and phenomena

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