Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs

Keyphrases

• Analog Circuits 100%
• MOSFET 100%
• Electrical Characteristics 100%
• Lifetime Estimation 100%
• Transistor 50%
• ISAT 50%
• Threshold Voltage 50%
• Dielectric Degradation 50%
• Current-voltage 50%
• Interface Traps 50%
• Saturation Level 50%
• Saturation Current 50%
• Reliability Criteria 50%
• Analog Applications 50%
• Fowler-Nordheim 50%
• Interfacial Traps 50%
• Wear-out Effect 50%
• Subthreshold Slope 50%
• Operation Voltage 50%

Engineering

• Metal-Oxide-Semiconductor Field-Effect Transistor 100%
• Analog Circuit 100%
• Direct Relation 50%
• Subthreshold Slope 50%
• Dielectrics 50%
• Interface Trap 50%

Material Science

• Metal-Oxide-Semiconductor Field-Effect Transistor 100%
• Analogue Circuit 100%
• Density 50%
• Transistor 50%
• Dielectric Material 50%