Latch Up Characterization Using Novel Test Structures and Instruments

C. Cané, M. Lozano, E. Cabruja, J. Anguita, LORA TAMAYO E., F. Serra Mestres

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Idioma original	Anglès
Pàgines (de-a)	---
Revista	IEEE Transactions on Semiconductor Manufacturing
Volum	4
Número	3
Estat de la publicació	Publicada - 1 de gen. 1991

Com citar-ho

@article{2a11985e022a4e9c97df0dccca1f8daa,

title = "Latch Up Characterization Using Novel Test Structures and Instruments",

author = "C. Can{\'e} and M. Lozano and E. Cabruja and J. Anguita and E., {LORA TAMAYO} and Mestres, {F. Serra}",

year = "1991",

month = jan,

day = "1",

language = "English",

volume = "4",

pages = "------",

journal = "IEEE Transactions on Semiconductor Manufacturing",

issn = "0894-6507",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "3",

}

TY - JOUR

T1 - Latch Up Characterization Using Novel Test Structures and Instruments

AU - Cané, C.

AU - Lozano, M.

AU - Cabruja, E.

AU - Anguita, J.

AU - E., LORA TAMAYO

AU - Mestres, F. Serra

PY - 1991/1/1

Y1 - 1991/1/1

M3 - Article

SN - 0894-6507

VL - 4

SP - ---

JO - IEEE Transactions on Semiconductor Manufacturing

JF - IEEE Transactions on Semiconductor Manufacturing

IS - 3

ER -