Investigation on electrical stress over metal-insulator-metal (MIM) structures based on compound dielectrics for the inkjet-printed OTFT stability

Kalyan Y. Mitra; Enrico Sowade; Christoph Sternkiker; Carme Martínez-Domingo; Eloi Ramon; Jordi Carrabina; Reinhard R. Baumann

Investigation on electrical stress over metal-insulator-metal (MIM) structures based on compound dielectrics for the inkjet-printed OTFT stability

Kalyan Y. Mitra, Enrico Sowade, Christoph Sternkiker, Carme Martínez-Domingo, Eloi Ramon, Jordi Carrabina, Reinhard R. Baumann

Producció científica: Contribució a revista › Article › Recerca

Idioma original	Anglès
Pàgines (de-a)	129-133
Revista	Applied Mechanics and Materials
Volum	748
Estat de la publicació	Publicada - 1 de gen. 2015

Com citar-ho

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title = "Investigation on electrical stress over metal-insulator-metal (MIM) structures based on compound dielectrics for the inkjet-printed OTFT stability",

author = "Mitra, {Kalyan Y.} and Enrico Sowade and Christoph Sternkiker and Carme Mart{\'i}nez-Domingo and Eloi Ramon and Jordi Carrabina and Baumann, {Reinhard R.}",

year = "2015",

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language = "English",

volume = "748",

pages = "129--133",

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TY - JOUR

T1 - Investigation on electrical stress over metal-insulator-metal (MIM) structures based on compound dielectrics for the inkjet-printed OTFT stability

AU - Mitra, Kalyan Y.

AU - Sowade, Enrico

AU - Sternkiker, Christoph

AU - Martínez-Domingo, Carme

AU - Ramon, Eloi

AU - Carrabina, Jordi

AU - Baumann, Reinhard R.

PY - 2015/1/1

Y1 - 2015/1/1

M3 - Article

SN - 1660-9336

VL - 748

SP - 129

EP - 133

JO - Applied Mechanics and Materials

JF - Applied Mechanics and Materials

ER -