Investigation of Conductivity Changes in Memristors under Massive Pulsed Characterization

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Memristors offer a huge potential for neuromorphic systems, where a precise control of its conductivity is needed. In this work, an automatic measurement setup, which allows a massive electrical characterization of memristors with pulsed voltages, is presented. The flexibility of the setup has allowed the definition of different test schemes, to analyze the impact of pulse parameters (amplitude, width and polarity) on the memristor conductivity. From the results, the suitable pulse parameters to control the memristor conductivity range, as required in neuromorphic applications, can be determined.

Idioma originalEnglish
EditorInstitute of Electrical and Electronics Engineers Inc.
Nombre de pàgines4
ISBN (electrònic)9781728101712
Estat de la publicacióPublicada - 3 d’abr. 2019

Sèrie de publicacions

NomProceedings - 33rd Conference on Design of Circuits and Integrated Systems, DCIS 2018


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