The effects on the oxide degradation of a low field of opposite polarity to that used during the stress have been analysed. Two different methods have been used: the analysis of stress-induced leakage current data and a recently proposed two-step stress method. The last procedure suggests a relaxation of the degradation process. © 2001 Elsevier Science Ltd. All rights reserved.
|Estat de la publicació||Publicada - 1 de gen. 2001|