Hrem Characterization of Interfaces in Thin Mocvd Superconducting Films

D DORIGNAC, S SCHAMM, C GRIGIS, J SANTISO, G GARCIA, A FIGUERAS

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This paper is concerned with high-T-c superconducting compounds produced by metal-organic chemical vapour deposition. The nanostructure of different types of interfaces yttria stabilized zirconia buffer/(1-102)-sapphire substrate, YBa2Cu3O7-x film/Y2O3 precipitates as well as YBa2Cu3O7-x film/(001)-NdGaO3, SrTiO3, and -MgO substrates - has been investigated by high resolution electron microscopy. The orientation relationships and the corresponding layer sequences across the interfaces have been determined with the aid of computer simulations.
Idioma originalEspanyol
Pàgines (de-a)927-934
Nombre de pàgines8
RevistaEuropean Physical Journal: Special Topics
Volum5
NúmeroC5
DOIs
Estat de la publicacióPublicada - de juny 1995

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