@inbook{8f8bc589936e4eb58f23b318318433df,
title = "Experimental study and modeling of the temperature dependence of soft breakdown conduction in ultrathin gate oxides",
abstract = "In this work, we focus our interest on the temperature dependence of soft breakdown conduction (SBD), mainly in the range in which real devices are commonly operated (-20/spl deg/C",
keywords = "Temperature dependence, Electric breakdown, Electrons, Physics, Temperature distribution, Shape, Electrodes, Threshold voltage, Analytical models, Conductors",
author = "A. Avell{\'a}n and E. Miranda and B. Sell and W. Krautschneider",
year = "2003",
doi = "10.1109/RELPHY.2003.1197815",
language = "English",
isbn = "0-7803-7649-8",
series = "ieee international reliability",
pages = "580--581",
booktitle = "2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.",
}