Experimental Observation and Modeling of the Impact of Traps on Static and Analog/HF Performance of Graphene Transistors

Anibal Pacheco-Sanchez, Nikolaos Mavredakis, Pedro C. Feijoo, Wei Wei, Emiliano Pallecchi, Henri Happy, David Jimenez

Producció científica: Contribució a revistaArticleRecercaAvaluat per experts

16 Cites (Scopus)

Fingerprint

Navegar pels temes de recerca de 'Experimental Observation and Modeling of the Impact of Traps on Static and Analog/HF Performance of Graphene Transistors'. Junts formen un fingerprint únic.

Keyphrases

Engineering