Experimental Characterization of Time-Dependent Variability in Ring Oscillators

J. Nuñez, E. Roca, R. Castro-Lopez, J. Martin-Martinez, R. Rodriguez, M. Nafria, F. V. Fernandez

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3 Cites (Scopus)


Reliability in CMOS-based integrated circuits has always been a critical concern. In today's ultra-scaled technologies, a time-varying kind of variability has raised that, on top of the well-known time-zero variability, threatens to shorten the lifetime of integrated circuits, both analog and digital. Effects like Bias Temperature Instability and Hot Carriers Injection need to be studied, characterized and modeled to include, and, thus, mitigate, their impact in the design of CMOS integrated circuits. This paper presents an array-based integrated circuit whose purpose is precisely that: to observe, quantify and characterize the impact of time-dependent variability effects in a specific kind of circuits: Ring Oscillators.

Idioma originalEnglish
EditorInstitute of Electrical and Electronics Engineers Inc.
Nombre de pàgines4
ISBN (electrònic)9781728112015
Estat de la publicacióPublicada - de jul. 2019

Sèrie de publicacions

NomSMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Proceedings


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