Electrical resolution during Conductive AFM measurements under different environmental conditions and contact forces

M. Lanza, M. Porti, M. Nafría, X. Aymerich, E. Wittaker, B. Hamilton

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48 Cites (Scopus)

Idioma original	Anglès
Pàgines (de-a)	106110-
Revista	Review of Scientific Instruments
Volum	81
Número	10
DOIs	https://doi.org/10.1063/1.3491956
Estat de la publicació	Publicada - 1 de març 2010

Accés al document

@article{1adf662407584ee18fbbf78f0d76f224,

title = "Electrical resolution during Conductive AFM measurements under different environmental conditions and contact forces",

author = "M. Lanza and M. Porti and M. Nafr{\'i}a and X. Aymerich and E. Wittaker and B. Hamilton",

year = "2010",

month = mar,

day = "1",

doi = "10.1063/1.3491956",

language = "English",

volume = "81",

pages = "106110--",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "10",

}

TY - JOUR

T1 - Electrical resolution during Conductive AFM measurements under different environmental conditions and contact forces

AU - Lanza, M.

AU - Porti, M.

AU - Nafría, M.

AU - Aymerich, X.

AU - Wittaker, E.

AU - Hamilton, B.

PY - 2010/3/1

Y1 - 2010/3/1

UR - https://www.scopus.com/pages/publications/78149439249

U2 - 10.1063/1.3491956

DO - 10.1063/1.3491956

M3 - Article

SN - 0034-6748

VL - 81

SP - 106110-

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 10

ER -