Effects of high-field electrical stress on the conduction properties of ultrathin La2 O3 films

Keyphrases

• High Field 100%
• Electrical Stress 100%
• Conduction Properties 100%
• Ultrathin 100%
• La2O3 100%
• Electron Transport 50%
• Dielectric Breakdown 50%
• Leakage Current 50%
• Constant Voltage Stress 50%
• Series Resistance 50%
• Insulating Layer 50%
• Current-voltage Characteristics 50%
• Metal-insulator 50%
• Closed-form Expression 50%
• Silicon Devices 50%
• Characteristic-based 50%
• Oxide Layer 50%
• Structure Prior 50%
• Diode-like 50%
• Parallel Resistance 50%
• Current Step 50%
• Tunneling Conduction 50%
• Fowler-Nordheim Tunneling 50%
• Lambert W Function 50%
• Lanthanum Oxide 50%

Material Science

• Current Voltage Characteristics 100%
• Silicon Device 100%
• Lanthanum 100%
• Electrical Breakdown 100%
• Electron Transfer 100%
• Film 100%
• Oxide Compound 100%