Effect of anisotropy on the critical antiferromagnet thickness in exchange-biased bilayers

M. S. Lund, W. A. Macedo, Kai Liu, J. Nogués, Ivan K. Schuller, C. Leighton

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97 Cites (Scopus)

Idioma original	Anglès
Número d’article	054422
Pàgines (de-a)	544221-544227
Revista	Physical Review B-Condensed Matter
Volum	66
Número	5
DOIs	https://doi.org/10.1103/PhysRevB.66.054422
Estat de la publicació	Publicada - 1 d’ag. 2002

Accés al document

@article{2600c4f06e604fb896360f03bbc9d59d,

title = "Effect of anisotropy on the critical antiferromagnet thickness in exchange-biased bilayers",

author = "Lund, {M. S.} and Macedo, {W. A.} and Kai Liu and J. Nogu{\'e}s and Schuller, {Ivan K.} and C. Leighton",

year = "2002",

month = aug,

day = "1",

doi = "10.1103/PhysRevB.66.054422",

language = "English",

volume = "66",

pages = "544221--544227",

number = "5",

}

TY - JOUR

T1 - Effect of anisotropy on the critical antiferromagnet thickness in exchange-biased bilayers

AU - Lund, M. S.

AU - Macedo, W. A.

AU - Liu, Kai

AU - Nogués, J.

AU - Schuller, Ivan K.

AU - Leighton, C.

PY - 2002/8/1

Y1 - 2002/8/1

U2 - 10.1103/PhysRevB.66.054422

DO - 10.1103/PhysRevB.66.054422

M3 - Article

SN - 0163-1829

VL - 66

SP - 544221

EP - 544227

JO - Physical Review B-Condensed Matter

JF - Physical Review B-Condensed Matter

IS - 5

M1 - 054422

ER -