Edge classification using photo-geometric features

J.M. Gonfaus, T. Gevers, A. Gijsenij, F.X. Roca, J. Gonzalez

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Idioma original	Anglès
Revista	Proceedings - International Conference on Pattern Recognition
Volum	(GGS Rating A-, Class 2)
Estat de la publicació	Publicada - 2012

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@article{68fa3378e45a47f9bce11abb8193c492,

title = "Edge classification using photo-geometric features",

author = "J.M. Gonfaus and T. Gevers and A. Gijsenij and F.X. Roca and J. Gonzalez",

year = "2012",

language = "English",

volume = "(GGS Rating A-, Class 2)",

journal = "Proceedings - International Conference on Pattern Recognition",

issn = "1051-4651",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Edge classification using photo-geometric features

AU - Gonfaus, J.M.

AU - Gevers, T.

AU - Gijsenij, A.

AU - Roca, F.X.

AU - Gonzalez, J.

PY - 2012

Y1 - 2012

UR - https://www.scopus.com/pages/publications/84874573006

M3 - Article

SN - 1051-4651

VL - (GGS Rating A-, Class 2)

JO - Proceedings - International Conference on Pattern Recognition

JF - Proceedings - International Conference on Pattern Recognition

ER -