Chemical short-range order and lattice deformations in Mgy Ti1-y Hx thin films probed by hydrogenography

R. Gremaud*, A. Baldi, M. Gonzalez-Silveira, B. Dam, R. Griessen

*Autor corresponent d’aquest treball

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Resum

A multisite lattice gas approach is used to model pressure-optical- transmission isotherms (PTIs) recorded by hydrogenography on Mgy Ti1-y Hx sputtered thin films. The model reproduces the measured PTIs well and allows us to determine the chemical short-range order parameter s. The s values are in good agreement with those determined from extended x-ray absorption fine structure measurements. Additionally, the PTI multisite modeling yields a parameter L that accounts for the local lattice deformations with respect to the average Mgy Ti1-y lattice given by Vegard's law. It is thus possible to extract two essential characteristics of a metastable alloy from hydrogenographic data.

Idioma originalEnglish
Número d’article144204
Nombre de pàgines10
RevistaPhysical Review B - Condensed Matter and Materials Physics
Volum77
Número14
DOIs
Estat de la publicacióPublicada - 8 d’abr. 2008

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