TY - JOUR
T1 - Automatic pattern generation for the electrical characterization of digital modules
AU - Ribas, Ll
AU - Riera, J.
AU - Pérez, J. M.
AU - Saiz, J.
AU - Carrabina, J.
AU - Terés, Ll
PY - 1993/1/1
Y1 - 1993/1/1
N2 - A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. © 1993.
AB - A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. © 1993.
UR - https://www.scopus.com/pages/publications/0027812971
U2 - 10.1016/0165-6074(93)90100-Y
DO - 10.1016/0165-6074(93)90100-Y
M3 - Article
SN - 0165-6074
VL - 39
SP - 255
EP - 258
JO - Microprocessing and Microprogramming
JF - Microprocessing and Microprogramming
ER -