Analysis of the evolution of the trapped charge distributions in 10 nm SiO2 films during DC and bipolar dynamic stress.: Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97)

R Rodriguez; M Nafría; J Suñé; X Aymerich; N Labat; A Touboul

Analysis of the evolution of the trapped charge distributions in 10 nm SiO2 films during DC and bipolar dynamic stress. Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97)

R Rodriguez, M Nafría, J Suñé, X Aymerich, N Labat (Editor), A Touboul (Editor)

Departament d'Enginyeria Electrònica

Producció científica: Tipus de llibre o informe › Llibre d'Actes › Recerca

Idioma original	No s'ha definit/desconegut
Lloc de publicació	- (GB)
Nombre de pàgines	4
Estat de la publicació	Publicada - de jul. 1997

Com citar-ho

@book{27fcaf770c5a4fb1ab0e2c8c38dddbf5,

title = "Analysis of the evolution of the trapped charge distributions in 10 nm SiO2 films during DC and bipolar dynamic stress.: Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97)",

author = "R Rodriguez and M Nafr{\'i}a and J Su{\~n}{\'e} and X Aymerich",

editor = "N Labat and A Touboul",

year = "1997",

month = jul,

language = "Indefinido/desconocido",

}

Analysis of the evolution of the trapped charge distributions in 10 nm SiO2 films during DC and bipolar dynamic stress. Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97). / Rodriguez, R; Nafría, M; Suñé, J et al.
- (GB), 1997. 4 pàg.

Producció científica: Tipus de llibre o informe › Llibre d'Actes › Recerca

TY - BOOK

T1 - Analysis of the evolution of the trapped charge distributions in 10 nm SiO2 films during DC and bipolar dynamic stress.

T2 - Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97)

AU - Rodriguez, R

AU - Nafría, M

AU - Suñé, J

AU - Aymerich, X

A2 - Labat, N

A2 - Touboul, A

PY - 1997/7

Y1 - 1997/7

M3 - Libro de Actas

BT - Analysis of the evolution of the trapped charge distributions in 10 nm SiO2 films during DC and bipolar dynamic stress.

CY - - (GB)

ER -