Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide".: Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference.

J. Suñé; R. Rodríguez; M. Nafría; X. Aymerich; IEEE Electron Device Society

Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide". Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference.

J. Suñé, R. Rodríguez, M. Nafría, X. Aymerich, IEEE Electron Device Society (Editor)

Producció científica: LLibre/informe › Llibre d'Actes › Recerca

Idioma original	No s'ha definit/desconegut
Lloc de publicació	San Diego (US)
Nombre de pàgines	2
Estat de la publicació	Publicada - de juny 1998

Com citar-ho

@book{594c3b1fc15442e78d5268f07444f8ab,

title = "Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference. {"}Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide{"}.: Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference.",

author = "J. Su{\~n}{\'e} and R. Rodr{\'i}guez and M. Nafr{\'i}a and X. Aymerich",

editor = "Society, \{IEEE Electron Device\}",

year = "1998",

month = jun,

language = "Indefinido/desconocido",

}

Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide". Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference. / Suñé, J.; Rodríguez, R.; Nafría, M. et al.
San Diego (US), 1998. 2 pàg.

Producció científica: LLibre/informe › Llibre d'Actes › Recerca

TY - BOOK

T1 - Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide".

T2 - Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference.

AU - Suñé, J.

AU - Rodríguez, R.

AU - Nafría, M.

AU - Aymerich, X.

A2 - Society, IEEE Electron Device

PY - 1998/6

Y1 - 1998/6

M3 - Libro de Actas

BT - Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide".

CY - San Diego (US)

ER -

Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide". Abstracts of the 29th IEEE Semniconductor Interfase Specialists Conference.

Com citar-ho

Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference. "Undestanding the Conduction Properties of a Breakdown Spot in thin Oxide". Abstracts of the 29^th IEEE Semniconductor Interfase Specialists Conference.