@book{78dfe6dd9e9049ad9d13e15888d04898,
title = "A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation",
abstract = "This paper addresses the automated parameter extraction of Random Telegraph Noise (RTN) models in nanoscale field-effect transistors. Unlike conventional approaches based on complex extraction of current levels and timing of trapping/de-Trapping events from individual defects in current traces, the proposed approach performs a simple processing of current traces. A smart optimization problem formulation allows getting distribution functions of the amplitude of the current shifts and of the number of active defects vs.Time.",
keywords = "modeling characterization, RTN, time-dependent variability",
author = "P. Saraza-Canflanca and J. Martin-Martinez and E. Roca and R. Castro-Lopez and R. Rodriguez and M. Nafria and Fernandez, {F. V.}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.",
year = "2022",
doi = "10.1109/SMACD55068.2022.9816234",
language = "English",
series = "Proceedings - 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
}