TY - JOUR
T1 - A Semiphysical Large-Signal Compact Carbon Nanotube FET Model for Analog RF Applications
AU - Schroter, Michael
AU - Haferlach, Max
AU - Pacheco-Sanchez, Anibal
AU - Mothes, Sven
AU - Sakalas, Paulius
AU - Claus, Martin
PY - 2015/1/1
Y1 - 2015/1/1
N2 - A compact large-signal model, called Compact Carbon Nanotube Model (CCAM), is presented that accurately describes the shape of DC and small-signal characteristics of fabricated carbon nano-tube FETs (CNTFETs). The new model consists of computationally efficient and smooth current and charge formulations. The model allows, for a given gate length, geometry scaling from single-finger single-tube to multifinger multitube transistors. Ambipolar transport, temperature dependence with self-heating, noise, and a simple trap model have also been included. The new model shows excellent agreement with the data from both the Boltzmann transport equation and measurements of Schottky-barrier CNTFETs and has been implemented in Verilog-A, making it widely available across circuit simulators.
AB - A compact large-signal model, called Compact Carbon Nanotube Model (CCAM), is presented that accurately describes the shape of DC and small-signal characteristics of fabricated carbon nano-tube FETs (CNTFETs). The new model consists of computationally efficient and smooth current and charge formulations. The model allows, for a given gate length, geometry scaling from single-finger single-tube to multifinger multitube transistors. Ambipolar transport, temperature dependence with self-heating, noise, and a simple trap model have also been included. The new model shows excellent agreement with the data from both the Boltzmann transport equation and measurements of Schottky-barrier CNTFETs and has been implemented in Verilog-A, making it widely available across circuit simulators.
UR - https://www.scopus.com/pages/publications/84920158052
U2 - 10.1109/ted.2014.2373149
DO - 10.1109/ted.2014.2373149
M3 - Article
VL - 62
SP - 52
EP - 60
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
IS - 1
ER -