A novel contactless technique for thermal field mapping and thermal conductivity determination: Two-Laser Raman Thermometry

J. S. Reparaz, E. Chavez-Angel, M. R. Wagner, B. Graczykowski, J. Gomis-Bresco, F. Alzina, C. M. Sotomayor Torres

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    Resum

    We present a novel contactless technique for thermal conductivity determination and thermal field mapping based on creating a thermal distribution of phonons using a heating laser, while a second laser probes the local temperature through the spectral position of a Raman active mode. The spatial resolution can be as small as 300 nm, whereas its temperature accuracy is ±2 K. We validate this technique investigating the thermal properties of three free-standing single crystalline Si membranes with thickness of 250, 1000, and 2000 nm. We show that for two-dimensional materials such as free-standing membranes or thin films, and for small temperature gradients, the thermal field decays as T(r) â̂©2014 AIP Publishing LLC.
    Idioma originalAnglès
    Número d’article034901
    RevistaReview of Scientific Instruments
    Volum85
    Número3
    DOIs
    Estat de la publicacióPublicada - 1 de gen. 2014

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