A mathematical morphology-based system for IC's inspection and analysis

F.X. Pérez, J. Sànchez, X. Binefa, X. Roca, J. Vitrià, J.J. Villanueva

Producció científica: Contribució a revista › Article › Recerca

Idioma original	Anglès
Pàgines (de-a)	381-384
Revista	Journal of Physics: Conference Series
Volum	135
Estat de la publicació	Publicada - 1 de gen. 1994

Com citar-ho

@article{8936285bd86a46d7b154c631bd04cc7f,

title = "A mathematical morphology-based system for IC's inspection and analysis",

author = "F.X. P{\'e}rez and J. S{\`a}nchez and X. Binefa and X. Roca and J. Vitri{\`a} and J.J. Villanueva",

year = "1994",

month = jan,

day = "1",

language = "English",

volume = "135",

pages = "381--384",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

}